Electronic Components Datasheet Search |
|
74F842 Datasheet(PDF) 6 Page - NXP Semiconductors |
|
74F842 Datasheet(HTML) 6 Page - NXP Semiconductors |
6 / 12 page Philips Semiconductors Product data 74F841/74F842 10-bit bus interface latches, non-inverting/inverting (3-State) 2004 Jan 23 6 DC ELECTRICAL CHARACTERISTICS Over recommended operating free-air temperature range unless otherwise noted. SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT IO =15 mA ± 10%VCC 2.2 – – V VO HIGH level output voltage VCC = MIN; VIL = MAX; IOH = –15 mA ± 5%VCC 2.2 3.3 – V VOH HIGH-level output voltage VIL = MAX; VIH = MIN IO =24 mA ± 10%VCC 2.0 – – V IOH = –24 mA ± 5%VCC 2.0 – – V VO LOW level output voltage VCC = MIN; VIL = MAX; IOL = 32 mA ± 10%VCC – 0.38 0.55 V VOL LOW-level output voltage VIL = MAX; VIH = MIN IOL = 48 mA ± 5%VCC – 0.38 0.55 V VIK Input clamp voltage VCC = MIN; II = IIK – –0.73 –1.2 V II Input current at maximum input voltage VCC = 0 V; VI = 7.0 V – – 100 µA IIH HIGH-level input current VCC = MAX; VI = 2.7 V – – 20 µA IIL LOW-level input current VCC = MAX; VI = 0.5 V – – –20 µA IOZH Off-state output current, HIGH-level voltage applied VCC = MAX; VO = 2.7 V – – 50 µA IOZL Off-state output current, LOW-level voltage applied VCC = MAX; VO = 0.5 V – – –50 µA IOS Short-circuit output current3 VCC = MAX –100 – –225 mA ICCH – 50 65 mA 74F841 ICCL VCC = MAX – 60 80 mA ICC Supply current ICCZ – 70 92 mA ICC y (total) ICCH – 40 60 mA 74F842 ICCL VCC = MAX – 65 90 mA ICCZ – 60 90 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5 V, Tamb = 25 °C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter test, IOS tests should be performed last. |
Similar Part No. - 74F842 |
|
Similar Description - 74F842 |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.NET |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |