Electronic Components Datasheet Search |
|
FSA2267AMUX Datasheet(PDF) 4 Page - Fairchild Semiconductor |
|
FSA2267AMUX Datasheet(HTML) 4 Page - Fairchild Semiconductor |
4 / 15 page © 2005 Fairchild Semiconductor Corporation www.fairchildsemi.com FSA2267 / FSA2267A Rev. 1.0.2 4 ESD Protection ESD Performance of the FSA2267/FSA2267A FSA2267 ■ HBM all pins 7.0kV ■ CDM all pins 1.0kV FSA267A ■ HBM all pins 7.5kV ■ CDM all pins 1.0kV Human Body Model Figure 1 shows the schematic representation of the Human Body Model ESD event. Figure 2 is the ideal waveform representation of the Human Body Model. The device is tested to JEDEC: JESD22-A114 Human Body Model. Charged Device Model In manufacturing test and handling environments, a more useful model is the Charged Device Model and the FSA2267/FSA2267A has a very good ESD immunity to this model. The device is tested to JEDEC: JESD-C101 Charged Device Model. IEC 61000-4-2 The IEC 61000-4-2 standard covers ESD testing and performance of finished equipment and evaluates the equipment in its entirety for ESD immunity. Fairchild Semiconductor has evaluated this device using the IEC 6100-4-2 representative system model depicted in Figure 3. ESD values measured via the IEC 61000-4-2 evaluation method are influenced by the specific board layout, board size, and many other factors of the manufacturer’s product application. Measured system ESD values can- not be guaranteed by Fairchild Semiconductor to exactly correlate to a manufacturer’s in-house testing due to these application environment variables. Fairchild Semi- conductor has been able to determine that, for ultra-por- table applications, an enhanced ESD immunity, relative to the IEC 61000-4-2 specification, can be achieved with the inclusion of a 100 Ω−series resistor in the VCC supply path to the analog switch (see Figure 4). Typical improvements of between 3-6kV of ESD immunity (I/O to GND) have been measured with the inclusion of the resistor with the IEC 61000-4-2 representative model. For more information on ESD testing methodologies, please refer to: AN-6019 Fairchild Analog Switch Products ESD Test Methodology Overview http://www.fairchildsemi.com/an/AN/AN-6019.pdf. Additional ESD Test Conditions For information regarding test methodologies and perfor- mance levels, please contact Fairchild Semiconductor. Figure 1. Human Body ESD Test Model Figure 2. HBM Current Waveform Figure 3. IEC 61000-4-2 ESD Test Model Figure 4. ESD Immunity with 100 Ω Resistor 1B0 1B1 2B0 2B1 1A 1S 2A 2S ESD Event 100 Analog Switch Supply Rail Ultra-portable Connector VCC |
Similar Part No. - FSA2267AMUX |
|
Similar Description - FSA2267AMUX |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.NET |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |