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ABSOLUTE MAXIMUM RATINGS

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ADS5240

SBAS326C – JUNE 2004 – REVISED DECEMBER 2004

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated

circuits be handled with appropriate precautions. Failure to observe proper handling and installation

procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision

integrated circuits may be more susceptible to damage because very small parametric changes could

cause the device not to meet its published specifications.

SPECIFIED

PACKAGE

TEMPERATURE

PACKAGE

ORDERING

TRANSPORT

PRODUCT

PACKAGE-LEAD

DESIGNATOR

RANGE

MARKING

NUMBER

MEDIA, QUANTITY

ADS5240IPAP

Tray, 160

ADS5240

PAP

-40

°C to +85°C

ADS5240I

ADS5240IPAPT

Tape and Reel, 1000

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For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet.

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Thermal pad size: 5.29mm

× 5.29mm (min), 6.50mm × 6.50mm (max).

Supply Voltage Range, AVDD

-0.3V to +3.8V

Supply Voltage Range, LVDD

-0.3V to +3.8V

Voltage Between AVSS and LVSS

-0.3V to +0.3V

Voltage Between AVDD and LVDD

-0.3V to +0.3V

Voltage Applied to External REF Pins

-0.3V to +2.4V

All LVDS Data and Clock Outputs

-0.3V to +2.4V

Analog Input Pins

-0.15V to +3.0V

Peak Total Input Current (all inputs)

30mA

Junction Temperature

+105

°C

-40

°C to +85°C

Lead Temperature, 1.6mm (1/16" from case for 10s)

220

°C

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Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

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