IC41C16256

IC41LV16256

Integrated Circuit Solution Inc.

7

DR018-0C 04/23/2004

(Recommended Operating Conditions unless otherwise noted.)

Symbol Parameter

Test Condition

Speed

Min.

Max.

Unit

Input Leakage Current

–10

10

µA

Other inputs not under test = 0V

Output Leakage Current

Output is disabled (Hi-Z)

–10

10

µA

Output High Voltage Level

2.4

—

V

Output Low Voltage Level

—

0.4

V

Standby Current: TTL

5V

—

2

mA

Industrial

5V

—

3

Commerical 3.3V

—

1

Industrial

3.3V

—

2

Standby Current: CMOS

5V

—

1

mA

3.3V

—

0.5

Operating Current:

RAS, LCAS, UCAS,

-25

—

260

mA

-35

—

230

Average Power Supply Current

-50

—

180

-60

—

170

Operating Current:

-25

—

250

mA

-35

—

220

Average Power Supply Current

-50

—

170

-60

—

160

Refresh Current:

-25

—

260

mA

-35

—

230

Average Power Supply Current

-50

—

180

-60

—

170

Refresh Current:

RAS, LCAS, UCAS Cycling

-25

—

260

mA

-35

—

230

Average Power Supply Current

-50

—

180

-60

—

170

Notes:

1. An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycles (RAS-Only or CBR) before proper device

2. Dependent on cycle rates.

3. Specified values are obtained with minimum cycle time and the output open.

4. Column-address is changed once each EDO page cycle.

5. Enables on-chip refresh and address counters.