NB100LVEP56

http://onsemi.com

4

Table 4. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

Positive Mode Power Supply

6

V

Negative Mode Power Supply

−6

V

Positive Mode Input Voltage

Negative Mode Input Voltage

6

−6

V

V

Output Current

Continuous

Surge

50

100

mA

mA

"0.5

mA

Operating Temperature Range

−40 to +85

°C

Storage Temperature Range

−65 to +150

°C

Thermal Resistance (Junction−to−Ambient)

JEDEC 51−3 (1S − Single Layer Test Board)

0 lfpm

500 lfpm

TSSOP−20

TSSOP−20

140

50

°C/W

°C/W

Thermal Resistance (Junction−to−Ambient)

JEDEC 51−6 (2S2P−Multi Layer Test Board)

with Filled Thermal Vias

0 lfpm

500 lfpm

QFN−24

QFN−24

37

32

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

Standard Board

TSSOP−20

QFN−24

23 to 41

11

°C/W

Wave Solder

Pb

Pb−Free

<2 to 3 sec @ 248°C

<2 to 3 sec @ 260°C

265

265

°C

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit

values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,

damage may occur and reliability may be affected.

−40°C

25°C

85°C

Symbol

Characteristic

Min

Typ

Max

Min

Typ

Max

Min

Typ

Max

Unit

Negative Power Supply Current

35

45

55

35

45

55

35

48

58

mA

Output HIGH Voltage (Note 3)

1355 1480 1605

1355

1480

1605

1355

1480

1605

mV

Output LOW Voltage (Note 3)

555

775

900

555

775

900

555

775

900

mV

Input HIGH Voltage (SEL0, SEL1, COM_SEL)

Input HIGH Voltage (D Inputs) (Note 4)

1335

1335

1620

1335

1335

1620

1275

1275

1620

mV

Input LOW Voltage (SEL0, SEL1, COM_SEL)

Input LOW Voltage (D Inputs) (Note 4)

555

875

875

555

875

875

555

875

875

mV

Input HIGH Voltage Common Mode Range

(Differential Configuration) (Note 5)

1.2

2.5

1.2

2.5

1.2

2.5

V

150

150

150

mA

D

SEL

0.5

−150

−150

0.5

−150

−150

0.5

−150

−150

mA

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit

board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared

operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit

values are applied individually under normal operating conditions and not valid simultaneously.

input signal.