Over recommended operating supply and temperature ranges unless otherwise specified. (Note 3)

Symbol

Parameter

Conditions

Min

Typ

Max

Units

LVDS OUTPUT AC SPECIFICATIONS (OUT)

t

LHT

Rise Time (Notes 5, 10)

20% to 80% points

R

Ω or 27Ω,C

Figure 3 and Figure 5

0.350

0.6

1.0

ns

t

HLT

Fall Time (Notes 5, 10)

80% to 20% points

0.350

0.6

1.0

ns

t

PHZ

Disable Time (Active High to Z) R

Ω,C

3

25

ns

t

PLZ

Disable Time (Active Low to Z)

Figure 6 and Figure 7

325

ns

t

PZH

Enable Time (Z to Active High)

100

120

ns

t

PZL

Enable Time (Z to Active Low)

100

120

ns

t

DJ

LVDS Data Jitter, Deterministic

(Peak-to-Peak) (Note 9)

V

400Mbps (NRZ)

78

ps

t

RJ

LVDS Clock Jitter, Random

(Note 9)

V

36

ps

f

MAX

Maximum guaranteed

frequency

(Note 11)

V

200

300

MHz

LVCMOS/LVTTL AC SPECIFICATIONS (LOS)

t

PHLLOS

LVTTL Propagation Delay High

to Low (Note 5)

CL = 10pF, IN− = 1V, 1V

≤ IN+ ≤ 1.3V,

Freq. = 10MHz, 50% Duty Cycle

Figures 8, 9

10

15

20

ns

t

PLHLOS

LVTTL Propagation Delay Low

to High (Note 5)

2

5

10

ns

t

LHLOS

Rise Time

20% to 80% (Note 5)

123

ns

t

HLLOS

Fall Time

80% to 20% (Note 5)

1

1.3

3

ns

Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the device

should be operated at these limits. The table of “Electrical Characteristics” specifies conditions of device operation.

Note 5: The parameters are guaranteed by design. The limits are based on statistical analysis of the device performance over the PVT (process, voltage and

temperature) range.

the same channel (a measure of duty cycle).

Note 9: The parameters are guaranteed by design. The limits are based on statistical analysis of the device performance over the PVT range with the following test

equipment setup: Agilent 86130A used as stimulus, 5 feet of RG142B cable with DUT test board and Agilent 86100A (digital scope mainframe) with Agilent 86122A

picoseconds.

Note 10: Propagation delay, rise and fall times are guaranteed by design and characterization to 200MHz. Generator for these tests: 50MHz

≤ f ≤ 200MHz, Zo =

50

Ω,tr, tf ≤ 0.5ns. Generator used was HP8130A (300MHz capability).

is guaranteed by design and characterization. A minimum is specified, which means that the device will operate to specified conditions from DC to the minimum

guaranteed AC frequency. The typical value is always greater than the minimum guarantee.

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