HN27C4000G-12 datasheet(6/20 Pages) HITACHI

Part #	HN27C4000G-12

Description	524288-Word 짰8-Bit/262144-Word X 16-Bit CMOS UV Erasable and Programmable ROM

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Manufacturer	HITACHI [Hitachi Semiconductor]

Direct Link	http://www.renesas.com/eng

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6 / 20 page

AC Characteristics (VCC = 5 V ± 10%, VPP = VSS to VCC, Ta = 0 to +70°C)

Test Conditions

• Input pulse levels: 0.45 to 2.4 V

• Input rise and fall times:

≤ 10 ns

• Output load: 1 TTL gate +100 pF

• Reference levels for measuring timing: 0.8 V, 2.0 V

HN27C4000 HN27C4000 HN27C4000

-10

-12

-15

Item

Symbol

Min

Max

Min

Max

Min

Max

Unit

Test conditions

Address to output delay

tACC

—

100

—

120

—

150

ns

CE = OE = VIL

CE to output delay

tCE

—

100

—

120

—

150

ns

OE = VIL

OE to output delay

tOE

—

60

—

60

—

70

ns

CE = VIL

Burst address to

tBAC

—

50

—

60

—

60

ns

CE = VIL

output delay

OE high to output float *1

tDF

0

35

0

40

0

50

ns

CE = VIL

Address to output hold

tOH

5—

ns

CE = OE = VIL

Note:

1. tDF is defined as the time at which the output achieves the open circuit condition and data is no

longer driven.

Read Timing Waveform

6

HN27C4000G Series

Address

CE

OE

Data Out

Data Out Valid

tACC

tCE

tOE

tOH

tDF

Standby mode

Active mode

Standby mode

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HN27C4000G-12 Datasheet(PDF) 6 Page - Hitachi Semiconductor

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