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SPT774 Datasheet(PDF) 5 Page - List of Unclassifed Manufacturers |
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SPT774 Datasheet(HTML) 5 Page - List of Unclassifed Manufacturers |
5 / 12 page SPT 5 8/1/00 SPT774 ELECTRICAL SPECIFICATIONS TA = TMIN to TMAX, VEE = 0 to +5 V, VDD = +5 V, fS = 117 kHz, fIN = 10 kHz, unless otherwise specified. TEST TEST SPT774C SPT774B PARAMETER CONDITIONS LEVEL MIN TYP MAX MIN TYP MAX UNITS AC ELECTRICAL CHARACTERISTICS4 Stand-Alone Mode Timing tHRL Low R/C Pulse Width VI 25 25 ns tDS STS Delay from R/C VI 200 200 ns tHDR Data Valid After R/C Low VI 25 25 ns tHS STS Delay After Data Valid VI 75 150 375 75 150 375 ns tHRH High R/C Pulse Width VI 100 100 ns tDDR Data Access Time VI 150 150 ns Sample-and-Hold Aperture Delay VEE = +5 V IV 20 20 ns Aperture Uncertainty Time VEE = +5 V V 300 300 ps, RMS Figure 4 - High Pulse for R/C - Outputs Enabled While R/C is High, Otherwise High Impedance Figure 3 - Low Pulse for R/C - Outputs Enabled After Conversion R/C t HRL DATA VALID DATA VALID DB11-DB0 STS t DS t C t HDR t HS DB11-DB0 t HRH STS t C t DDR t DS t HDR DATA VALID HIGH-Z R/C HIGH-Z TEST LEVEL CODES All electrical characteristics are subject to the following conditions: All parameters having min/max specifications are guaranteed. The Test Level column indi- cates the specific device testing actually per- formed during production and Quality Assur- ance inspection. Any blank section in the data column indicates that the specification is not tested at the specified condition. TEST PROCEDURE 100% production tested at the specified temperature. 100% production tested at TA=25 °C, and sample tested at the specified temperatures. QA sample tested only at the specified temperatures. Parameter is guaranteed (but not tested) by design and characterization data. Parameter is a typical value for information purposes only. 100% production tested at TA = 25 °C. Parameter is guaranteed over specified temperature range. TEST LEVEL I II III IV V VI |
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