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MSC2343257A Datasheet(PDF) 8 Page - OKI electronic componets |
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MSC2343257A Datasheet(HTML) 8 Page - OKI electronic componets |
8 / 8 page MSC2343257A-xxBS8/DS8 ¡ Semiconductor 108 See ADDENDUM I for AC Timing Waveforms Notes: 1. A start-up delay of 200 µs is required after power-up, followed by a minimum of eight initializationcycles(RAS-onlyrefreshorCASbefore RAS refresh)beforeproperdevice operation is achieved. 2. The AC characteristics assume tT = 5 ns. 3. VIH (Min.) and VIL (Max.) are reference levels for measuring input timing signals. Transition times (tT) are measured between VIH and VIL. 4. This parameter is measured with a load circuit equivalent to 2 TTL loads and 100 pF. 5. Operation within the tRCD (Max.) limit ensures that tRAC (Max.) can be met. tRCD (Max.) is specified as a reference point only. If tRCD is greater than the specified tRCD (Max.) limit, access time is controlled by tCAC. 6. Operation within the tRAD (Max.) limit ensures that tRAC (Max.) can be met. tRAD (Max.) is specified as a reference point only. If tRAD is greater than the specified tRAD (Max.) limit, access time is controlled by tAA. 7. tCEZ (Max.), tREZ (Max.) and tWEZ (Max.) define the time at which the output achieves the open circuit condition and are not referenced to output voltage levels. 8. tCEZ and tREZ must be satisfied for open circuit condition. 9. tRCH or tRRH must be satisfied for a read cycle. 10. The test mode is initiated by performing a WE and CAS before RAS refresh cycle. This mode is latched and remains in effect until the exit cycle is generated. The test mode specified in this data sheet is an 8-bit parallel test function. CA0, CA1 and CA10 are not used. In a read cycle, if all internal bits are equal, the DQ pin will indicate a high level. If any internal bits are not equal, the DQ pin will indicate a low level. The test mode is cleared and the memory device returned to its normal operating state by performing a RAS-only refresh cycle or a CAS before RAS refresh cycle. The 4M ¥ 32 module can be tested as an 1M ¥ 32 module in this test mode. 11. In a test mode read cycle, the access time parameters are delayed by 5 ns. The test mode parameters are obtained by adding 5 ns to the normal read cycle values. |
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