CAT34FC02

2

Doc. No. 1045, Rev. L

© 2005 by Catalyst Semiconductor, Inc.

Characteristics subject to change without notice

Symbol

Test

Conditions

Min

Typ

Max

Units

Input/Output Capacitance (SDA)

8

pF

Input Capacitance (other pins)

6

pF

ABSOLUTE MAXIMUM RATINGS*

Temperature Under Bias

–55

°C to +125°C

Storage Temperature ....................... –65

°C to +150°C

Voltage on Any Pin with

Package Power Dissipation

°C) .................................. 1.0 W

Note:

(1) The minimum DC input voltage is –0.5 V. During transitions, inputs may undershoot to –2.0 V for periods of less than 20 ns. Maximum DC

(2) Output shorted for no more than one second. No more than one output shorted at a time.

(3) This parameter is tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100 and

JEDEC test methods.

(6) Maximum ESD susceptibility for die revision A = 2000 Volts.

D.C. OPERATING CHARACTERISTICS

Symbol

Parameter

Test Conditions

Min

Typ

Max

Units

Power Supply Current (Read)

1

mA

Power Supply Current (Write)

3

mA

1

µA

Input Leakage Current

1

µA

Output Leakage Current

1

µA

Input Low Voltage

V

Input High Voltage

V

0.4

V

0.5

V

Lead Soldering Temperature (10 seconds) ...... 300

°C

*COMMENT

Stresses above those listed under “Absolute Maximum Ratings” may

cause permanent damage to the device. These are stress ratings only,

and functional operation of the device at these or any other conditions

outside of those listed in the operational sections of this specification is not

implied. Exposure to any absolute maximum rating for extended periods

may affect device performance and reliability.

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Min.

Max.

Units

Endurance

1,000,000

Cycles/Byte

Data Retention

100

Years

ESD Susceptibility

4000

Volts

Latch-up

100

mA