V. Quality Assurance Information

A. Quality Assurance Contacts: Jim Pedicord

(Manager, Reliability Operations)

Bryan Preeshl

(Executive Director of QA)

Kenneth Huening (Vice President)

B. Outgoing Inspection Level:

0.1% for all electrical parameters guaranteed by the Datasheet.

0.1% For all Visual Defects.

C. Observed Outgoing Defect Rate: < 50 ppm

D. Sampling Plan: Mil-Std-105D

VI. Reliability Evaluation

A. Accelerated Life Test

The results of the 150

°C biased (static) life test are shown in Table 1. Using these results, the Failure Rate

(

λ) is calculated as follows:

λ =

1

=

1.83

(Chi square value for MTTF upper limit)

MTTF

192 x 9823 x 45 x 2

Temperature Acceleration factor assuming an activation energy of 0.8eV

λ = 10.78 F.I.T. (60% confidence level @ 25°C)

This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.

Maxim also performs weekly Burn-In on samples from production to assure reliability of its processes. The reliability

required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates to 3 failures

in an 80 piece sample.

Maxim performs failure analysis on rejects from lots exceeding this level.

The Burn-In

Schematic (Spec.# 06-7097) shows the static circuit used for this test.

Maxim also performs 1000 hour life test

monitors quarterly for each process. This data is published in the Product Reliability Reports (RR-1M & RR-B3A).

B. Moisture Resistance Tests

Maxim evaluates pressure pot stress from every assembly process during qualification of each new design.

Pressure Pot testing must pass a 20% LTPD for acceptance. Additionally, industry standard 85

°C/85%RH or HAST

tests are performed quarterly per device/package family.

C. E.S.D. and Latch-Up Testing

The CR17 die type has been found to have all pins able to withstand a transient pulse of +/-200V, per Mil-Std-

883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a

current of

±250mA.