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H27UCG8T2BTR-BC Datasheet(PDF) 25 Page - Hynix Semiconductor |
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H27UCG8T2BTR-BC Datasheet(HTML) 25 Page - Hynix Semiconductor |
25 / 56 page H27UCG8T2BTR-BC 64Gb(8192M x 8bit) MLC NAND Flash Rev 0.1 / Oct. 2012 25 Figure 9 : Input data cycle timings Note: Data Input cycle is accepted to data register on the rising edge of WE#, when CLE and CE# and ALE are low, and device is not Busy state. Figure 10 : Data output cycle timings Notes: 1. Transition is measured +/-200mV from steady state voltage with load. This parameter is sampled and not 100% tested. ( tCHZ, tRHZ) 2. tRLOH is valid when frequency is higher than 10 MHz . tRHOH starts to be valid when frequency is lower than 10 MHz. 3.3. Input Data Latch Cycle Timings 3.4. Data Output Cycle Timings (CLE=L, WE#=H, ALE=L, WP#=H) |
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