PALCE22V10
USE ULTRA37000TM FOR
ALL NEW DESIGNS
Document #: 38-03027 Rev. *B
Page 4 of 13
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65
°C to +150°C
Ambient Temperature with
Power Applied.............................................–55
°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12) ........................................... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State ............................................... –0.5V to +7.0V
DC Input Voltage ............................................ –0.5V to +7.0V
Output Current into Outputs (LOW)............................. 16 mA
DC Programming Voltage............................................. 12.5V
Latch-up Current..................................................... > 200 mA
Static Discharge Voltage
(per MIL-STD-883, Method 3015) ............................ >2001V
Operating Range
Range
Ambient
Temperature
VCC
Commercial
0
°C to +75°C
5V
±5%
Industrial
–40
°C to +85°C5V ±10%
Military[1]
–55
°C to +125°C
5V
±10%
Electrical Characteristics Over the Operating Range[2]
Parameter
Description
Test Conditions
Min.
Max. Unit
VOH
Output HIGH Voltage
VCC = Min.,
VIN = VIH or VIL
IOH = –3.2 mA
Com’l
2.4
V
IOH = –2 mA
Mil/Ind
VOL
Output LOW Voltage
VCC = Min.,
VIN = VIH or VIL
IOL = 16 mA
Com’l
0.5
V
IOL = 12 mA
Mil/Ind
VIH
Input HIGH Level
Guaranteed Input Logical HIGH Voltage for All Inputs[3]
2.0
V
VIL
[4]
Input LOW Level
Guaranteed Input Logical LOW Voltage for All Inputs[3]
–0.5
0.8
V
IIX
Input Leakage Current
VSS < VIN < VCC, VCC = Max.
–10
10
µA
IOZ
Output Leakage Current
VCC = Max., VSS < VOUT < VCC
–40
40
µA
ISC
Output Short Circuit Current VCC = Max., VOUT = 0.5V
[5,6]
–30
–130 mA
ICC1
Standby Power Supply
Current
VCC = Max.,
VIN = GND,
Outputs Open in Unprogrammed
Device
10, 15, 25 ns
Com’l
90
mA
5, 7.5 ns
130
mA
15, 25 ns
Mil/Ind
120
mA
10 ns
120
mA
ICC2
[6]
Operating Power Supply
Current
VCC = Max., VIL = 0V, VIH = 3V,
Output Open, Device Programmed
as a 10-bit Counter,
f = 25 MHz
10, 15, 25 ns
Com’l
110
mA
5, 7.5 ns
Com’l
140
mA
15, 25 ns
Mil/Ind
130
mA
10 ns
Mil/Ind
130
mA
Capacitance[6]
Parameter
Description
Test Conditions
Min.
Max.
Unit
CIN
Input Capacitance
VIN = 2.0V @ f = 1 MHz
10
pF
COUT
Output Capacitance
VOUT = 2.0V @ f = 1 MHz
10
pF
Endurance Characteristics[6]
Parameter
Description
Test Conditions
Min.
Max.
Unit
N
Minimum Reprogramming Cycles
Normal Programming Conditions
100
Cycles
Notes:
1. TA is the “instant on” case temperature.
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. VIL (Min.) is equal to –3.0V for pulse durations less than 20 ns.
5. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
6. Tested initially and after any design or process changes that may affect these parameters.
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