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MM74HC190N Datasheet(PDF) 2 Page - National Semiconductor (TI) |
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MM74HC190N Datasheet(HTML) 2 Page - National Semiconductor (TI) |
2 / 8 page Absolute Maximum Ratings (Notes12) If MilitaryAerospace specified devices are required please contact the National Semiconductor Sales OfficeDistributors for availability and specifications Supply Voltage (VCC) b 05 to a70V DC Input Voltage (VIN) b 15 to VCCa15V DC Output Voltage (VOUT) b 05 to VCCa05V Clamp Diode Current (IIK IOK) g 20 mA DC Output Current per pin (IOUT) g 25 mA DC VCC or GND Current per pin (ICC) g 50 mA Storage Temperature Range (TSTG) b 65 Cto a150 C Power Dissipation (PD) (Note 3) 600 mW SO Package only 500 mW Lead Temp (TL) (Soldering 10 seconds) 260 C Operating Conditions Min Max Units Supply Voltage (VCC)2 6 V DC Input or Output Voltage 0 VCC V (VIN VOUT) Operating Temp Range (TA) MM74HC b 40 a 85 C MM54HC b 55 a 125 C Input Rise or Fall Times VCCe20V (tr tf) 1000 ns VCCe45V 500 ns VCCe60V 400 ns DC Electrical Characteristics (Note 4) TAe25 C 74HC 54HC Symbol Parameter Conditions VCC TAeb40 to 85 CTAeb55 to 125 C Units Typ Guaranteed Limits VIH Minimum High Level V V Input Voltage V V V V VIL Maximum Low Level V V Input Voltage V V V V VOH Minimum High Level VINeVIH or VIL Output Voltage lIOUTls mA V V V V V V VINeVIH or VIL lIOUTls mA V V lIOUTls mA V V VOL Maximum Low Level VINeVIH or VIL Output Voltage lIOUTls mA V V V V V V VINeVIH or VIL lIOUTls mA V V lIOUTls mA V V IIN Maximum Input VINeVCC or GND V g g g m A Current ICC Maximum Quiescent VINeVCC or GND V m A Supply Current IOUTe mA Note 1 Absolute Maximum Ratings are those values beyond which damage to the device may occur Note 2 Unless otherwise specified all voltages are referenced to ground Note 3 Power Dissipation temperature derating plastic ‘‘N’’ package b12 mW C from 65 Cto85 C ceramic ‘‘J’’ package b12 mW C from 100 Cto125 C Note 4 For a power supply of 5V g10% the worst case output voltages (VOH and VOL) occur for HC at 45V Thus the 45V values should be used when designing with this supply Worst case VIH and VIL occur at VCCe55V and 45V respectively (The VIH value at 55V is 385V) The worst case leakage current (IIN ICC and IOZ) occur for CMOS at the higher voltage and so the 60V values should be used VIL limits are currently tested at 20% of VCC The above VIL specification (30% of VCC) will be implemented no later than Q1 CY’89 2 |
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Similar Description - MM74HC190N |
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