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PALCE16V8L-10JI Datasheet(PDF) 4 Page - Cypress Semiconductor

Part # PALCE16V8L-10JI
Description  Flash-Erasable Reprogrammable CMOS PAL Device
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

PALCE16V8L-10JI Datasheet(HTML) 4 Page - Cypress Semiconductor

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USE ULTRA37000™ FOR
ALL NEW DESIGNS
PALCE16V8
Document #: 38-03025 Rev. *A
Page 4 of 13
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65
°C to +150°C
Ambient Temperature with
Power Applied............................................. –55
°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12) ........................................... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State ............................................... –0.5V to +7.0V
DC Input Voltage ............................................–0.5V to +7.0V
Output Current into Outputs (LOW)............................. 24 mA
DC Programming Voltage............................................. 12.5V
Latch-Up Current .................................................... > 200 mA
Operating Range
Range
Ambient Temperature
VCC
Commercial
0
°C to +75°C
5V
±5%
Military[1]
–55
°C to +125°C
5V
±10%
Industrial
–40
°C to +85°C5V ±10%
Electrical Characteristics Over the Operating Range[2]
Parameter
Description
Test Conditions
Min.
Max.
Unit
VOH
Output HIGH Voltage
VCC = Min.,
VIN = VIH or VIL
IOH = –3.2 mA
Com’l
2.4
V
IOH = –2 mA
Mil/Ind
VOL
Output LOW Voltage
VCC = Min.,
VIN = VIH or VIL
IOL = 24 mA
Com’l
0.5
V
IOL = 12 mA
Mil/Ind
VIH
Input HIGH Level
Guaranteed Input Logical HIGH Voltage for All Inputs[3]
2.0
V
VIL
[4]
Input LOW Level
Guaranteed Input Logical LOW Voltage for All Inputs[3]
–0.5
0.8
V
IIH
Input or I/O HIGH Leakage
Current
3.5V < VIN < VCC
10
µA
IIL
[5]
Input or I/O LOW Leakage
Current
0V < VIN < VIN (Max.)
–100
µA
ISC
Output Short Circuit Current VCC = Max., VOUT = 0.5V
[6, 7]
–30
–150
mA
ICC
Operating Power Supply
Current
VCC = Max.,
VIL = 0V, VIH = 3V,
Output Open,
f = 15 MHz
(counter)
5, 7 ns
Com’l
115
mA
10, 15, 25 ns
90
mA
15L, 25L ns
55
mA
10, 15, 25 ns
Mil/Ind
130
mA
15L, 25L ns
Mil.
65
mA
15L, 25L ns
Ind.
65
mA
Capacitance[7]
Parameter
Description
Test Conditions
Typ.
Unit
CIN
Input Capacitance
VIN = 2.0V @ f = 1 MHz
5
pF
COUT
Output Capacitance
VOUT = 2.0V @ f = 1 MHz
5
pF
Endurance Characteristics[7]
Parameter
Description
Test Conditions
Min.
Max.
Unit
N
Minimum Reprogramming Cycles
Normal Programming Conditions
100
Cycles
Notes:
1. TA is the “instant on” case temperature.
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. VIL (Min.) is equal to –3.0V for pulse durations less than 20 ns.
5. The leakage current is due to the internal pull-up resistor on all pins.
6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
7. Tested initially and after any design or process changes that may affect these parameters.


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