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M28C16-200N6T Datasheet(PDF) 6 Page - STMicroelectronics |
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M28C16-200N6T Datasheet(HTML) 6 Page - STMicroelectronics |
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6 / 17 page  Symbol Parameter Test Condition Min Max Unit CIN Input Capacitance VIN =0V 6 pF COUT Output Capacitance VOUT =0V 12 pF Note: 1. Sampled only, not 100% tested. Table 5. Capacitance (1) (TA =25 °C, f = 1 MHz ) Symbol Parameter Test Condition Min Max Unit ILI Input Leakage Current 0V ≤ VIN ≤ VCC 10 µA ILO Output Leakage Current 0V ≤ VIN ≤ VCC 10 µA ICC (1) Supply Current (CMOS inputs) E=VIL,G = VIL, f = 5 MHz, VCC = 3.3V 8 mA E=VIL,G = VIL, f = 5 MHz, VCC = 3.6V 10 mA ICC2 (1) Supply Current (Standby) CMOS E> VCC –0.3V 50 µA VIL Input Low Voltage – 0.3 0.6 V VIH Input High Voltage 2 VCC +0.5 V VOL Output Low Voltage IOL = 1 mA 0.2 VCC V VOH Output High Voltage IOH = 1 mA 0.8 VCC V Note: 1. All I/O’s open circuit. Table 6. Read Mode DC Characteristics (TA = 0 to 70 °C or –40 to 85°C; VCC = 2.7V to 3.6V) Symbol Parameter Min Max Unit tPUR Time Delay to Read Operation 1 µs tPUW Time Delay to Write Operation 10 ms VWI Write Inhibit Threshold 1.5 2.5 V Note: 1. Sampled only, not 100% tested. Table 7. Power Up Timing (1) (TA = 0 to 70 °C or –40 to 85°C; VCC = 2.7V to 3.6V) Input Rise and Fall Times ≤ 20ns Input Pulse Voltages 0V to VCC -0.3V Input and Output Timing Ref. Voltages 1.5V Note that Output Hi-Z is defined as the point where data is no longer driven. Table 4. AC Measurement Conditions AI01274 VCC –0.3V 0V 0.5 VCC Figure 7. AC Testing Input Output Waveforms AI01396 VCC OUT CL = 100pF CL includes JIG capacitance 1.8k Ω DEVICE UNDER TEST 1.3k Ω Figure 8. AC Testing Equivalent Load Circuit 6/17 M28LV16 |
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