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STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
SIZE
A
5962-90899
REVISION LEVEL
C
SHEET
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
-55
C T +125C 1/
C
4.5 V
V
5.5 V
CC
unless otherwise specified
Group A
Subgroups
Device
type
Limits
Units
Min
Max
DC CHARACTERISTICS
Input leakage
current
ILI
V
= V
max,
CC
CC
V
= V
max or V
IN
CC
SS
1, 2, 3
All
±1.0
µA
Output leakage
current
ILO
V
= V
max,
CC
CC
V
= V
max or V
OUT
CC
SS
1, 2, 3
All
±10
µA
V
standby
CC
current (TTL)
ICCS1
V
= V
max, C
E
= V
CC
CC
IH
1, 2, 3
All
1.0
mA
V
standby
CC
current (CMOS)
ICCS2
C
E
= V
±0.2 V,
CC
V
= V
max
CC
CC
1, 2, 3
All
100
µA
V
active read
CC
current
ICC1
V
= V
max, C
E
= V
CC
CC
IL
I
= 0 mA, f = 6.0 MHz,
OUT
O
E
= VIH
1, 2, 3
All
30
mA
V
programming
CC
current
ICC2
C
E
= V , programming in
IL
progress
1, 2, 3
All
30 2/
mA
V
erase
CC
current
ICC3
C
E
= V , erasure in progress
IL
1, 2, 3
All
30 2/
mA
V
standby
PP
current
IPPS
V
= V
PP
PPL
1, 2, 3
All
±10
µA
V
read current
PP
IPP1
V
= V
PP
PPH
1, 2, 3
All
200
µA
V
= V
PP
PPL
±10
V
programming
PP
current
IPP2
V
= V
, programming in
PP
PPH
progress
1, 2, 3
All
30 2/
mA
See footnotes at end of table.