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© Q-Star Test nv, 2003
Revision C - page 2 of 6
Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.
QA-1000HC
ELECTRICAL SPECIFICATIONS
Measured at VDUT=+5.00V, VCC= +12.0V, VEE= -12.0V, T=20°C
SYMBOL PARAMETER
CONDITION
MIN
TYP
MAX
UNITS
Power Supply
VCC
Positive Supply Voltage
+11.5
+12
+16
V
VEE
Negative Supply Voltage
-11.5
-12
-16
V
ICCQ
Quiescent Supply Current
@ IDUT=0mA
+12
+40
mA
IEEQ
Quiescent Supply Current
@ IDUT=0mA
-12
-40
mA
Input Range
IDUT
DUT Supply Current
0
2
A
VDUT
DUT Supply Voltage
(1)
-7.0
+7.0
V
IVDUT
Input Bias Current
2
µA
DC Accuracy
∆I
DUT
Resolution
(2)
@ CL=100nF, f-3dB=50kHz
@ CL=100nF, f-3dB=500kHz
@ CL=100nF, f-3dB=5MHz
0.3
1
2
mARMS
mARMS
mARMS
Measurement Offset
2
5
mA
Gain error
0.1
0.5
%
I/V
I/V Conversion Ratio
2.5
mV/mA
AC Characteristics
IDUT –3dB bandwidth
@ CL=100nF, JP2,3=OFF
@ CL=100nF, JP2=ON, JP3=OFF
@ CL=100nF, JP2=OFF, JP3=ON
5000
500
50
kHz
kHz
kHz
SR
Slew Rate
@ CL=100nF, JP2,3=OFF
TBD
V/µs
THD
Total Harmonic Distortion
@ CL=100nF
TBD
dB
DUT Output
IDUT
DUT current
-2
2
A
CL
Loading Capacitance CL
0
100
uF
Internal Resistance
Between DUT & VDUT
25
m
Ω
DUT – VDUT voltage drop
@ IDUT=2A
50
mV
(1)
The VDUT pin must be permanently connected to a voltage source and must notbe left floating.
(2)
Considering clean supplies and no external noise pick up at VDUT/DUT terminals such as switching noise from ATE power
supply.
ABSOLUTE MAXIMUM RATINGS
Parameter
With Respect To
Min
Max
Units
VCC
GND
-0.3
+18
V
VEE
GND
-18
+0.3
V
VDUT
GND
-0.3
10
V
IDUT
GND
-3
3
A
Operating Temperature Range
0
+70
°C
Storage Temperature
-40
+80
°C
Lead Temperature (10sec)
(1)
+220
°C
(1) Manual soldering is recommended using standard eutectic Sn63Pb solder.
NOTE: Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a
stress rating only; functional operation of the device at these or other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability.
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