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White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520
WF512K32-XXX5
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,CS CONTROLLED
(VCC = 5.0V, VSS = 0V, TA = -55
°C to +125°C)
FIG. 4
AC TEST CIRCUIT
AC TEST CONDITIONS
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75
Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
I
Current Source
D.U.T.
C
= 50 pf
eff
I
OL
V
≈ 1.5V
(Bipolar Supply)
Z
Current Source
OH
Parameter
Symbol
-60
-70
-90
-120
-150
Unit
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Write Cycle Time
tAVAV
tWC
60
70
90
120
150
ns
Write Enable Setup Time
tWLEL
tWS
00
0
0
0
ns
Chip Select Pulse Width
tELEH
tCP
40
45
45
50
50
ns
Address Setup Time
tAVEL
tAS
00
0
0
0
ns
Data Setup Time
tDVEH
tDS
40
45
45
50
50
ns
Data Hold Time
tEHDX
tDH
00
0
0
0
ns
Address Hold Time
tELAX
tAH
40
45
45
50
50
ns
Chip Select Pulse Width High
tEHEL
tCPH
20
20
20
20
20
ns
Duration of Byte Programming Operation (1)
tWHWH1
300
300
300
300
300
µs
Sector Erase Time (2)
tWHWH2
15
15
15
15
15
sec
Read Recovery Time
tGHEL
00
0
0
0
ns
Chip Programming Time
11
11
11
11
11
sec
Chip Erase Time (3)
64
64
64
64
64
sec
NOTES:
1. Typical value for tWHWH1 is 7
µs.
2. Typical value for tWHWH2 is 1sec.
3. Typical value for Chip Erase Time is 8sec.
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