Revision 1.1

Jan.

2004

3

R0201-BS616LV1013

SYMBOL

PARAMETER

TEST CONDITIONS

MIN.

MAX.

UNITS

Vcc for Data Retention

CE ≧ Vcc - 0.2V

1.5

--

--

V

Data Retention Current

CE ≧ Vcc - 0.2V

--

0.02

0.3

uA

Chip Deselect to Data

Retention Time

0

--

--

ns

Operation Recovery Time

See Retention Waveform

(2)

--

--

ns

SYMBOL

PARAMETER

CONDITIONS

MAX.

UNIT

Input

Capacitance

6

pF

Input/Output

Capacitance

8

pF

RANGE

AMBIENT

TEMPERATURE

Vcc

Commercial

0

2.7V ~ 3.6V

Industrial

-40

2.7V ~ 3.6V

2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included.

3. Fmax = 1/t

2. t

OPERATING RANGE

1. Stresses greater than those listed under ABSOLUTE MAXIMUM

RATINGS may cause permanent damage to the device. This is a

stress rating only and functional operation of the device at these

or any other conditions above those indicated in the operational

sections of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

reliability.

1. This parameter is guaranteed and not 100% tested.

SYMBOL

PARAMETER

RATING

UNITS

Terminal

Voltage

with

Respect to GND

-0.5 to

Vcc+0.5

V

Temperature Under Bias

-40 to +125

Storage Temperature

-60 to +150

Power Dissipation

1.0

W

DC Output Current

20

mA

BSI

BS616LV1013

PARAMETER

NAME

PARAMETER

TEST CONDITIONS

UNITS

Vcc=3.0V

Guaranteed Input Low

Voltage

(2)

-0.5

--

0.8

V

Vcc=3.0V

2.0

Guaranteed Input High

Voltage

(2)

--

Vcc+0.2

V

Input Leakage Current

--

--

1

uA

Output Leakage Current

--

--

1

uA

Vcc=3.0V

Output Low Voltage

--

--

0.4

V

Vcc=3.0V

Output High Voltage

2.4

--

--

V

Vcc=3.0V

--

--

20

Operating Power Supply

Current

(3)

mA

Vcc=3.0V

--

--

1

Standby Current-TTL

mA

Vcc=3.0V

--

0.02

Standby Current-CMOS

CE ≧ Vcc -0.2V,

0.5

uA