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IDT70V5388S166BGI Datasheet(PDF) 9 Page - Integrated Device Technology |
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IDT70V5388S166BGI Datasheet(HTML) 9 Page - Integrated Device Technology |
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9 / 29 page  6.42 IDT70V5388/78 3.3V 64/32K x 18 Synchronous FourPort™ Static RAM Industrial and Commercial Temperature Ranges 9 Symbol Parameter Test Conditions 70V5388/78S Unit Min. Max. |ILI| Input Leakage Current(1) VDD = Max., VIN = 0V to VDD ___ 10 µA |ILI| JTAG Input Leakage Current(1,2) VDD = Max., VIN = 0V to VDD ___ 30 µA |ILO| Output Leakage Current(1) VOUT = 0V to VDD, Outputs in tri-state mode ___ 10 µA VOL Output Low Voltage IOL = +4mA, VDD = Min. ___ 0.4 V VOH Output High Voltage IOH = -4mA, VDD = Min. 2.4 ___ V 5649 tbl 10 DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range (VDD = 3.3V ± 150mV) NOTE: 1. At VDD < 2.0V leakages are undefined. 2. Applicable only for TMS, TDI and TRST inputs. Symbol Rating Commercial & Industrial Unit VTERM(2) Terminal Voltage with Respect to GND -0.5 to +4.6 V TBIAS(3) Temperature Under Bias -55 to +125 o C TSTG Storage Temperature -65 to +150 o C TJN Junction Temperature +150 o C IOUT DC Output Current 50 mA 5623 tbl 06 Symbol Parameter Conditions(2) Max. Unit CIN Input Capacitance VIN = 3dV 8 pF COUT(3) Output Capacitance VOUT = 3dV 10.5 pF 5649 tbl 09 Absolute Maximum Ratings(1) NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. VTERM must not exceed VDD + 150mV for more than 25% of the cycle time or 4ns maximum, and is limited to < 20mA for the period of VTERM > VDD + 150mV. 3. Ambient Temperature under DC Bias. No AC conditions. Chip Deselected. Capacitance(1) (TA = +25°C, F = 1.0MHZ) NOTES: 1. These parameters are determined by device characterization, but are not production tested. 2. 3dV references the interpolated capacitance when the input and output switch from 0V to 3V or from 3V to 0V. 3. COUT also references CI/O. |
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