MC74LVX573

http://onsemi.com

2

Figure 2. Logic Diagram

O0

D0

O1

D1

O2

D2

O3

D3

O4

D4

O5

D5

O6

D6

O7

D7

nLE

Q

D

nLE

Q

D

nLE

Q

D

nLE

Q

D

nLE

Q

D

nLE

Q

D

nLE

Q

D

nLE

Q

D

LE

OE

2

3

4

5

6

7

8

9

19

18

17

16

15

14

13

12

11

1

Table 1. PIN NAMES

Pins

Function

OE

LE

D0−D7

O0−O7

Output Enable Input

Latch Enable Input

Data Inputs

3−State Latch Outputs

INPUTS

OUTPUTS

OE

LE

Dn

On

OPERATING MODE

L

L

H

H

H

L

H

L

Transparent (Latch

Disabled); Read Latch

L

L

L

L

h

l

H

L

Latched (Latch Enabled)

Read Latch

L

L

X

NC

Hold; Read Latch

H

L

X

Z

Hold; Disabled Outputs

H

H

H

H

H

L

Z

Z

Transparent (Latch

Disabled); Disabled Outputs

H

H

L

L

h

l

Z

Z

Latched (Latch Enabled);

Disabled Outputs

H = High Voltage Level; h = High Voltage Level One Setup Time

Prior to the Latch Enable High−to−Low Transition; L = Low

Voltage Level; l = Low Voltage Level One Setup Time Prior to the

Latch Enable High−to−Low Transition; NC = No Change, State

Prior to the Latch Enable High−to−Low Transition; X = High or

Low Voltage Level or Transitions are Acceptable; Z = High

MAXIMUM RATINGS

Symbol

Parameter

Value

Unit

DC Supply Voltage

–0.5 to +7.0

V

DC Input Voltage

–0.5 to +7.0

V

DC Output Voltage

V

Input Diode Current

−20

mA

Output Diode Current

±20

mA

DC Output Current, per Pin

±25

mA

±75

mA

Power Dissipation

180

mW

Storage Temperature

–65 to +150

°C

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit

values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,

damage may occur and reliability may be affected.