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28C256TRPDB-12 Datasheet(PDF) 1 Page - Maxwell Technologies |
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28C256TRPDB-12 Datasheet(HTML) 1 Page - Maxwell Technologies |
1 / 14 page 1 All data sheets are subject to change without notice (858) 503-3300 - Fax: (858) 503-3301- www.maxwell.com 256K EEPROM (32K x 8-Bit) 28C256T ©2001 Maxwell Technologies All rights reserved. EEPROM 02.18.02 Rev 5 FEATURES: •RAD-PAK® radiation-hardened against natural space radia- tion • Total dose hardness: - > 100 Krad (Si), dependent upon space mission • Excellent Single Event Effects: - SEL TH LET: > 120 MeV/mg/cm 2 - SEU TH LET (read mode): > 90 MeV/mg/cm 2 - SEU TH LET (write mode): > 18 MeV/mg/cm 2 • Package: - 28 pin RAD-PAK® flat pack - 28 pin RAD-PAK® DIP - JEDEC approved byte wide pinout • High Speed: - 120, 150 ns maximum access times available • High endurance: - 10,000 erase/write (in Page Mode), 10-year data retention • Page Write Mode: - 1 to 64 bytes • Low power dissipation: - 15 mA active current (cycle = 1 µ s) - 20 µ A standby current (CE = V CC) DESCRIPTION: Maxwell Technologies’ 28C256T high density 256k-bit EEPROM microcircuit features a greater than 100 krad (Si) total dose tolerance, depending upon space mission. The 28C256T is capable of in-system electrical byte and page pro- grammability. It has a 64-Byte page programming function to make its erase and write operations faster. It also features data polling to indicate the completion of erase and program- ming operations. Maxwell Technologies' patented RAD-PAK® packaging technol- ogy incorporates radiation shielding in the microcircuit pack- age. It eliminates the need for box shielding while providing the required radiation shielding for a lifetime in orbit or space mission. In a GEO orbit, RAD-PAK provides greater than 100 krad (Si) radiation dose tolerance. This product is available with screening up to Class S. OE, CE, and WE LOGIC Y DECODER X DECODER DATA LATCH INPUT/OUTPUT BUFFERS Y-GATING CELL MATRIX IDENTIFICATION OE WE CE ADDRESS INPUTS V CC GND DATA INPUTS/OUTPUTS I/O0 - I/O7 Logic Diagram |
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