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AS29F040-90TC Datasheet(PDF) 11 Page - Alliance Semiconductor Corporation |
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AS29F040-90TC Datasheet(HTML) 11 Page - Alliance Semiconductor Corporation |
11 / 18 page ® $65<)373 $65<)373 $65<)373 $65<)373 ','#440533440$1#728233 ','#440533440$1#728233 ','#440533440$1#728233 ','#440533440$1#728233 $//,$1&(#6(0,&21'8&725 $//,$1&(#6(0,&21'8&725 $//,$1&(#6(0,&21'8&725 $//,$1&(#6(0,&21'8&725 44 44 44 44 0DUFK#5333 0DUFK#5333 0DUFK#5333 0DUFK#5333 '&#HOHFWULFDO#FKDUDFWHULVWLFV 9&&# #813±3189 * Not more than one output tested simultaneously. Duration of the short circuit must not be >1 second. OUT = 0.5V was selected to avoid test problems caused by tester ground degradation. (This parameter is sampled and not 100% tested, but guaranteed by characterization.) † The I CC current listed includes both the DC operating current and the frequency dependent component (@ 6 MHz). The frequency component typically is less than 2 mA/MHz with OE at VIH. ** I CC active while program or erase operations are in progress. 0D[LPXP#QHJDWLYH#RYHUVKRRW#ZDYHIRUP 0D[LPXP#SRVLWLYH#RYHUVKRRW#ZDYHIRUP Parameter Symbol Test conditions Min Max Unit Input load current ILI VIN = VSS to VCC, VCC = VCC MAX -±1 µA A9 Input load current ILIT VCC = VCC MAX, A9 = 12.5V 90 µA Output leakage current ILO VOUT = VSS to VCC, VCC = VCC MAX -±1 µA Output short circuit current* IOS VOUT = 0.5V - 200 mA Active current, read @ 6MHz † ICC CE = VIL, OE = VIH -30 mA Active current, program/erase** ICC2 CE = VIL, OE = VIH -60 mA Standby current (TTL) ISB1 CE = OE = VIH, VCC = VCC MAX -1.0 mA Standby current (CMOS) ISB2 CE = VCC + 0.5V, OE = VIH, VCC = VCC MAX -400 µA Input low voltage VIL -0.5 0.8 V Input high voltage VIH 2.0 VCC + 0.5 V Output low voltage VOL IOL = 12mA, VCC = VCC MIN -0.45 V Output high voltage VOH1 IOH = -2.5 mA, VCC = VCC MIN 2.4 - V VOH2 IOH = -100 µA, VCC = VCC MIN VCC - 0.4 - V Low VCC lock out voltage VLKO 2.8 4.2 V Input HV select voltage VID 11.5 12.5 V 20 ns 20 ns 20 ns -2.0V -0.5V +0.8V 20 ns 20 ns 20 ns VCC + 2.0V VCC + 0.5V + 2.0V |
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