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K4N51163QC-ZC33 Datasheet(PDF) 9 Page - Samsung semiconductor |
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K4N51163QC-ZC33 Datasheet(HTML) 9 Page - Samsung semiconductor |
9 / 64 page - 9 - Rev 1.5 Oct. 2005 512M gDDR2 SDRAM K4N51163QC-ZC Notes: 1. Absolute Specifications (0°C ≤ TCASE ≤ +95°C; VDD = +1.8V ±0.1V, VDDQ = +1.8V ±0.1V) 2. Impedance measurement condition for output source dc current: VDDQ = 1.7V; VOUT = 1420mV; (VOUT-VDDQ)/Ioh must be less than 23.4 ohms for values of VOUT between VDDQ and VDDQ-280mV. Impedance measurement condition for output sink dc current: VDDQ = 1.7V; VOUT = 280mV; VOUT/Iol must be less than 23.4 ohms for values of VOUT between 0V and 280mV. 3. Mismatch is absolute value between pull-up and pull-dn, both are measured at same temperature and voltage. 4. Slew rate measured from VIL(AC) to VIH(AC). 5. The absolute value of the slew rate as measured from DC to DC is equal to or greater than the slew rate as measured from AC to AC. This is guaran- teed by design and characterization. 6. This represents the step size when the OCD is near 18 ohms at nominal conditions across all process and represents only the DRAM uncertainty. Output slew rate load : 7. DRAM output slew rate specification applies to 533Mb/sec/pin, 667Mb/sec/pin, 800Mb/sec/pin, 900Mbps/sec/pin and 1000Mbps/sec/pin speed bins. 8. Timing skew due to DRAM output slew rate mis-match between DQS / DQS and associated DQs is included in tDQSQ and tQHS specification. 25 ohms VTT Output (VOUT) Reference Point Description Parameter Min Nom Max Unit Note Output impedance Normal 18ohms See full strength default driver characteristics ohms 1,2 Output impedance step size for OCD calibration 0 1.5 ohms 6 Pull-up and pull-down mismatch 0 4 ohms 1,2,3 Output slew rate Sout 1.5 5 V/ns 1,4,5,6,7,8 (Recommended operating conditions unless otherwise noted, 0 °C ≤ Tc ≤85°C ) Note : 1. Measured with outputs open and ODT off Parameter Symbol Test Condition Version Unit -25 -2A -33 -36 Operating Current (One Bank Active) ICC1 Burst Length=4 tRC ≥ tRC(min). IOL=0mA, tCC= tCC(min). DQ,DM,DQS inputs changing twice per clock cycle. Address and control inputs changing once per clock cycle TBD 140 TBD 130 mA Precharge Standby Current in Power-down mode ICC2P CKE ≤ VIL(max), tCC= tCC(min) TBD 10 mA Precharge Standby Current in Non Power-down mode ICC2N CKE ≥ VIH(min), CS ≥ VIH(min),tCC= tCC(min) Address and control inputs changing once per clock cycle TBD 40 TBD 35 mA Active Standby Current power-down mode ICC3P CKE ≤ VIL(max), tCC= tCC(min) Fast PDN Exit MRS(12) = 0mA TBD 30 TBD 25 mA Slow PDN Exit MRS(12) = 1mA TBD 12 TBD 12 Active Standby Current in in Non Power-down mode ICC3N CKE ≥ VIH(min), CS ≥ VIH(min), tCC= tCC(min) DQ,DM,DQS inputs changing twice per clock cycle. Address and control inputs changing once per clock cycle TBD 60 TBD 55 mA Operating Current ( Burst Mode) ICC4 IOL=0mA ,tCC= tCC(min), Page Burst, All Banks activated. DQ,DM,DQS inputs changing twice per clock cycle. Address and control inputs changing once per clock. TBD 200 TBD 170 mA Refresh Current ICC5 tRC ≥ tRFC TBD 160 TBD 165 mA Self Refresh Current ICC6 CKE ≤ 0.2V TBD 8 TBD 8 mA Operating Current (4Bank interleaving) ICC7 Burst Length=4 tRC ≥ tRC(min). IOL=0mA, tCC= tCC(min). DQ,DM,DQS inputs changing twice per clock cycle. Address and control inputs changing once per clock cycle TBD 350 TBD 320 mA 8.8 DC characteristics 8.7 OCD default characteristics |
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Similar Description - K4N51163QC-ZC33 |
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