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MC100EL1648M Datasheet(PDF) 5 Page - ON Semiconductor |
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MC100EL1648M Datasheet(HTML) 5 Page - ON Semiconductor |
5 / 14 page MC100EL1648 http://onsemi.com 5 GENERIC TEST CIRCUITS: Bypass to Supply Opposite GND Figure 3. Typical Test Circuit with Alternate Tank Circuits 0.1 mF C L 8 (10) 1 (12) 4 (3) VCC * Use high impedance probe (>1.0 M W must be used). ** The 1200 W resistor and the scope termination impedance constitute a 25:1 attenuator probe. Coax shall be CT−070−50 or equivalent. 3 (1) 2 (14) C L 4 (3) VCC 3 (1) 2 (14) VIN FOUT Tank #1 8 (10) 1 (12) * Note 1 Capacitor for tank may be variable type. (See Tank Circuit #3.) Note 2 Use high impedance probe (> 1 M W ). Test Point FOUT Tank #2 Tank Circuit Option #1, Varactor Diode Tank Circuit Option #2, Fixed LC L = Micro Metal torroid #T20−22, 8 turns #30 Enameled Copper wire (@ 40 nH) C = MMBV609 L = Micro Metal torroid #T20−22, 8 turns #30 Enameled Copper wire (@ 40 nH) C = 3.0−35pF Variable Capacitance (@ 10 pF) 0.1 mF0.1 mF 0.1 mF0.1 mF 8 pin (14 pin) Lead Package 8 pin (14 pin) Lead Package ** 5 (5) 6 (7) 7 (8) VEE 0.1 mF 0.1 mF 0.01 mF 100 mF 5 (5) 6 (7) 7 (8) VEE 0.1 mF 0.1 mF 0.01 mF 100 mF 1 K W 50% ta tb VP−P PRF = 1.0MHz Duty Cycle (Vdc) − ta tb Figure 4. Output Waveform |
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