PI74FCT377T

OCTAL D FLIP-FLOP with CLOCK ENABLE

2

PS2017A 03/11/96

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Maximum Ratings

(Above which the useful life may be impaired. For user guidelines, not tested.)

Storage Temperature .................................................................... –65°C to +150°C

Ambient Temperature with Power Applied .....................................-40°C to +85°C

Supply Voltage to Ground Potential (Inputs & Vcc Only) .............. –0.5Vto+7.0V

Supply Voltage to Ground Potential (Outputs & D/O Only) ........... –0.5Vto+7.0V

DC Input Voltage ............................................................................ –0.5Vto+7.0V

DC Output Current ..................................................................................... 120mA

Power Dissipation .......................................................................................... 0.5W

Note:

Stresses greater than those listed under

MAXIMUM RATINGS may cause permanent

damage to the device. This is a stress rating

only and functional operation of the device at

these or any other conditions above those

indicated in the operational sections of this

specification is not implied. Exposure to

absolute maximum rating conditions for

extended periods may affect reliability.

Parameters Description

Test Conditions

(1)

Min.

Typ

(2)

Max.

Units

Output HIGH Voltage

2.4

3.0

V

Output LOW Current

0.3

0.55

V

Input HIGH Voltage

Guaranteed Logic HIGH Level

2.0

V

Input LOW Voltage

Guaranteed Logic LOW Level

0.8

V

Input HIGH Current

1µA

Input LOW Current

–1

µA

Clamp Diode Voltage

–0.7

–1.2

V

Short Circuit Current

–60

–120

mA

Power Down Disable

—

—

100

µA

Input Hysteresis

200

mV

Parameters

(4)

Description

Test Conditions

Typ

Max.

Units

Input Capacitance

6

10

pF

Output Capacitance

8

12

pF

Notes:

1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at Vcc = 5.0V, +25°C ambient and maximum loading.

3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.

4. This parameter is determined by device characterization but is not production tested.