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54F407SDMQB Datasheet(PDF) 5 Page - National Semiconductor (TI) |
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54F407SDMQB Datasheet(HTML) 5 Page - National Semiconductor (TI) |
5 / 10 page Absolute Maximum Ratings (Note 1) If MilitaryAerospace specified devices are required please contact the National Semiconductor Sales OfficeDistributors for availability and specifications Storage Temperature b 65 Cto a150 C Ambient Temperature under Bias b 55 Cto a125 C Junction Temperature under Bias b 55 Cto a175 C VCC Pin Potential to Ground Pin b 05V to a70V Input Voltage (Note 2) b 05V to a70V Input Current (Note 2) b 30 mA to a50 mA Voltage Applied to Output in HIGH State (with VCC e 0V) Standard Output b 05V to VCC TRI-STATE Output b 05V to a55V Current Applied to Output in LOW State (Max) twice the rated IOL (mA) Note 1 Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired Functional operation under these conditions is not implied Note 2 Either voltage limit or current limit is sufficient to protect inputs Recommended Operating Conditions Free Air Ambient Temperature Military b 55 Cto a125 C Supply Voltage Military a 45V to a55V DC Electrical Characteristics Symbol Parameter 54F Units VCC Conditions Min Typ Max VIH Input HIGH Voltage 20 V Recognized as a HIGH Signal VIL Input LOW Voltage 08 V Recognized as a LOW Signal VCD Input Clamp Diode Voltage b 15 V Min IIN eb18 mA VOH Output HIGH 54F 10% VCC 24 V Min IOH eb04 mA (CO) Voltage 54F 10% VCC 24 IOH eb2mA(X0–X3 O0–O3) VOL Output LOW 54F 10% VCC 05 V Min IOL e 4mA(CO) Voltage 54F 10% VCC 05 IOL e 8mA(X0–X3 O0–O3) IIH Input HIGH Current 54F 200 m A Max VIN e 27V IBVI Input HIGH Current 54F 100 m A Max VIN e 70V Breakdown Test ICEX Output HIGH 54F 250 m A Max VOUT e VCC Leakage Current IIL Input LOW Current b 04 mA Max VIN e 05V IOZH Output Leakage Current 50 m A Max VOUT e 27V (X0–X3 O0–O3) IOZL Output Leakage Current b 50 m A Max VOUT e 05V (X0–X3 O0–O3) IOS Output Short-Circuit Current b 30 b 100 mA Max VOUT e 0V ICC Power Supply Current 90 145 mA Max 5 |
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