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K7I643682M-EI30 Datasheet(PDF) 9 Page - Samsung semiconductor

Part # K7I643682M-EI30
Description  72Mb M-die DDRII SRAM Specification 165 FBGA with Pb & Pb-Free (RoHS compliant)
Download  17 Pages
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Manufacturer  SAMSUNG [Samsung semiconductor]
Direct Link  http://www.samsung.com/Products/Semiconductor
Logo SAMSUNG - Samsung semiconductor

K7I643682M-EI30 Datasheet(HTML) 9 Page - Samsung semiconductor

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2Mx36 & 4Mx18 DDRII CIO b2 SRAM
K7I643682M
K7I641882M
- 9 -
Rev 1.0
Aug. 2005
ABSOLUTE MAXIMUM RATINGS*
*Note: 1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. VDDQ must not exceed VDD during normal operation.
PARAMETER
SYMBOL
RATING
UNIT
Voltage on VDD Supply Relative to VSS
VDD
-0.5 to 2.9
V
Voltage on VDDQ Supply Relative to VSS
VDDQ
-0.5 to VDD
V
Voltage on Input Pin Relative to VSS
VIN
-0.5 to VDD+0.3
V
Storage Temperature
TSTG
-65 to 150
°C
Operating Temperature (Commercial / Industrial)
TOPR
0 to 70 / -40 to 85
°C
Storage Temperature Range Under Bias
TBIAS
-10 to 85
°C
DC ELECTRICAL CHARACTERISTICS(VDD=1.8V
±0.1V, TA=0°C to +70°C)
Notes: 1. Minimum cycle. IOUT=0mA.
2. |IOH|=(VDDQ/2)/(RQ/5)
±15% for 175Ω ≤ RQ ≤ 350Ω. |IOL|=(VDDQ/2)/(RQ/5)±15% for 175Ω ≤ RQ ≤ 350Ω.
3. Minimum Impedance Mode when ZQ pin is connected to VDDQ.
4. Operating current is calculated with 50% read cycles and 50% write cycles.
5. Standby Current is only after all pending read and write burst opeactions are completed.
6. Programmable Impedance Mode.
7. These are DC test criteria. DC design criteria is VREF
±50mV. The AC VIH/VIL levels are defined separately for measuring timing parameters.
8. VIL (Min)DC=
-0.3V, VIL (Min)AC=-1.5V(pulse width
≤ 3ns).
9. VIH (Max)DC=
VDDQ+0.3, VIH (Max)AC=VDDQ+0.85V(pulse width
≤ 3ns).
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
MAX
UNIT
NOTES
Input Leakage Current
IIL
VDD=Max ; VIN=VSS to VDDQ
-2
+2
µA
Output Leakage Current
IOL
Output Disabled,
-2
+2
µA
Operating Current (x36):
QDR mode
ICC
VDD=Max , IOUT=0mA
Cycle Time
≥ tKHKH Min
-30
-
900
mA
1,4
-25
-
800
-20
-
700
-16
650
Operating Current (x18):
QDR mode
ICC
VDD=Max , IOUT=0mA
Cycle Time
≥ tKHKH Min
-30
-
850
mA
1,4
-25
-
750
-20
-
650
-16
-
600
Standby Current(NOP):
QDR mode
ISB1
Device deselected, IOUT=0mA,
f=Max,
All Inputs
0.2V or ≥ VDD-0.2V
-30
-
400
mA
1,5
-25
-
380
-20
-
360
-16
-
340
Output High Voltage
VOH1
VDDQ/2-0.12 VDDQ/2+0.12
V
2,6
Output Low Voltage
VOL1
VDDQ/2-0.12 VDDQ/2+0.12
V
2,6
Output High Voltage
VOH2
IOH=-1.0mA
VDDQ-0.2
VDDQ
V3
Output Low Voltage
VOL2
IOL=1.0mA
VSS
0.2
V
3
Input Low Voltage
VIL
-0.3
VREF-0.1
V
7,8
Input High Voltage
VIH
VREF+0.1
VDDQ+0.3
V
7,9
OPERATING CONDITIONS (0
°C ≤ TA ≤ 70°C)
PARAMETER
SYMBOL
MIN
MAX
UNIT
Supply Voltage
VDD
1.7
1.9
V
VDDQ
1.4
1.9
V
Reference Voltage
VREF
0.68
0.95
V


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