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IXSX40N60CD1 Datasheet(PDF) 1 Page - IXYS Corporation |
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IXSX40N60CD1 Datasheet(HTML) 1 Page - IXYS Corporation |
1 / 2 page 1 - 2 © 2000 IXYS All rights reserved G = Gate, C = Collector, E = Emitter, TAB = Collector Symbol Test Conditions Maximum Ratings V CES T J = 25 °C to 150°C 600 V V CGR T J = 25 °C to 150°C; R GE = 1 MW 600 V V GES Continuous ±20 V V GEM Transient ±30 V I C25 T C = 25 °C, limited by leads 75 A I C90 T C = 90 °C40 A I CM T C = 25 °C, 1 ms 150 A SSOA V GE= 15 V, TVJ = 125°C, RG = 22 W I CM = 80 A (RBSOA) Clamped inductive load, L = 30 mH @ 0.8 V CES t SC V GE= 15 V, VCE = 360 V, TJ = 125°C 10 ms (SCSOA) R G = 22 W, non repetitive P C T C = 25 °C 280 W T J -55 ... +150 °C T JM 150 °C T stg -55 ... +150 °C M d Mounting torque (TO-264) 0.9/6 Nm/lb.in. Maximum lead temperature for soldering 300 °C 1.6 mm (0.062 in.) from case for 10 s Weight TO-264 10 g PLUS247 6 g V CES = 600 V I C25 = 75 A V CE(sat) = 2.5 V t fi(typ) = 70 ns Symbol Test Conditions Characteristic Values (T J = 25°C, unless otherwise specified) min. typ. max. BV CES I C = 1 mA, V GE = 0 V 600 V V GE(th) I C = 4 mA, V CE = VGE 47 V I CES V CE = 0.8 • V CES T J = 25 °C 650 mA V GE = 0 V T J = 150°C5 mA I GES V CE = 0 V, V GE = ±20 V ±100 nA V CE(sat) I C = I C90, VGE = 15 V 2.5 V 98574A (7/00) PLUS 247TM (IXSX) IGBT with Diode PLUS247TM package Short Circuit SOA Capability IXSK 40N60CD1 IXSX 40N60CD1 Features • International standard packages • Guaranteed Short Circuit SOA capability • High frequency IGBT and anti- parallel FRED in one package • Latest generation HDMOSTM process • MOS Gate turn-on - drive simplicity • Fast Recovery,low leakageEpitaxial Diode - soft recovery with low I RM Applications • AC motor speed control • DC servo and robot drives • DC choppers • Uninterruptible power supplies (UPS) • Switch-mode and resonant-mode power supplies Advantages • PLUS 247TMpackage for clip or spring mounting • Space savings (two devices in one package) • Reduces assembly time and cost TO-264 AA G C E (IXSK) G C E C (TAB) IXYS reserves the right to change limits, test conditions, and dimensions. Preliminary data |
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