Product Specification

PE3342

Page 3 of 17

Document No. 70-0091-03

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©2005 Peregrine Semiconductor Corp. All rights reserved.

18

13

Dout

Output

Data out function. Dout is defined with the Enhancement Register and enabled with

ENH

.

19

14

(Note 1)

Same as pin 1.

20

15

PD_

D

Output

Phase detector output. PD_D pulses negatively when fp leads fc.

21

16

PD_

U

Output

Phase detector output. PD_U pulses negatively when fc leads fp.

22

17

EESel

Input

Control line for Frequency Register selection, EE Register parallel loading, and

EEPROM programming. Internal 70 k

Ω pull-up resistor.

23

GND

(Note 2)

Ground.

24

18

Input

Reference frequency input.

Table 3. DC Electrical Specifications

Pin No.

TSSOP

Pin No.

QFN

Pin Name

Type

Description

level.

2: Ground connections are made through the exposed solder pad. The solder pad must be soldered to the ground plane for proper operation .

Table 2. Absolute Maximum Ratings

Symbol

Parameter/Conditions

Min

Max

Units

Supply voltage

–0.3

+4.0

V

Voltage on any digital

input

–0.3

V

Storage temperature

range

–65

+85

°C

Symbol

Parameter/Conditions

Min

Max

Units

Supply voltage

2.85

3.15

V

Operating ambient

temperature range

-40

85

°C

Symbol

Parameter/Conditions

Min

Max

Units

ESD voltage human body

model (Note 1)

1000

V

ESD voltage human body

model (Note 1)

200

V

Note 1:

Periodically sampled, not 100% tested. Tested per MIL-

STD-883, M3015 C2

Table 4. ESD Ratings

Electrostatic Discharge (ESD) Precautions

When handling this UltraCMOS™ device, observe

the same precautions that you would use with

other ESD-sensitive devices. Although this device

contains circuitry to protect it from damage due to

ESD, precautions should be taken to avoid

exceeding the specified rating in Table 4.

Latch-Up Avoidance

Unlike conventional CMOS devices, UltraCMOS™

devices are immune to latch-up.

Absolute Maximum Ratings are those values

listed in the above table. Exceeding these values

may cause permanent device damage.

Functional operation should be restricted to the

limits in the DC and AC Characteristics table.

Exposure to absolute maximum ratings for

extended periods may affect device reliability.