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AN77L09 Datasheet(PDF) 4 Page - Panasonic Semiconductor |
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AN77L09 Datasheet(HTML) 4 Page - Panasonic Semiconductor |
4 / 8 page 4 Voltage Regulators AN77L00/AN77L00M Series Output voltage Input stability Load stability Bias current under no load Bias current fluctuation under load Bias current before regulation start Ripple rejection ratio Min. input/output voltage difference (1) Min. input/output voltage difference (2) Output noise voltage Output voltage temperature coefficient Tj=25˚C VI=5.18 to 15.18V, Tj=25˚C IO= 0 to 100mA, Tj=25˚C IO= 0mA, Tj=25˚C IO= 0 to 100mA, Tj=25˚C VI= 4.05V, IO= 0mA, Tj=25˚C VI=7.18 to 6.18V, f=120Hz VI= 4.05V, IO=50mA, Tj=25˚C VI= 4.05V, IO=100mA, Tj=25˚C f=10Hz to 100kHz Tj= –30 to+125˚C 4.32 58 4.5 3 10 0.9 3 1.5 68 0.12 0.23 85 0.3 4.68 60 60 1.5 5 5 0.25 0.43 Parameter Symbol Condition min typ max Unit s Electrical Characteristics (Ta=25˚C) • AN77L045/M (4.5V, 100mA Type) Note 1) Under Tj=25˚C, each test duration can be set short (within 10ms) and the characteristic drift with temperature rise at joints of the chip may be ignored. Note 2) VI=5.5V, IO=50mA, CO=10 µF unless otherwise specified. VO REGIN REGL Ibias ∆I bias Irush RR VDIF (min) 1 VDIF (min) 2 Vno ∆V O/Ta V mV mV mA mA mA dB V V µV mV/˚C Output voltage Input stability Load stability Bias current under no load Bias current fluctuation under load Bias current before regulation start Ripple rejection ratio Min. input/output voltage difference (1) Min. input/output voltage difference (2) Output noise voltage Output voltage temperature coefficient Tj=25˚C VI=5.7 to 15.7V, Tj=25˚C IO= 0 to 100mA, Tj=25˚C IO= 0mA, Tj=25˚C IO= 0 to 100mA, Tj=25˚C VI= 4.5V, IO= 0mA, Tj=25˚C VI= 5.7 to 7.7V, f=120Hz VI= 4.5V, IO= 50mA, Tj=25˚C VI= 4.5V, IO= 100mA, Tj=25˚C f=10Hz to 100kHz Tj= –30 to+125˚C 4.8 58 5 4 10 0.9 3 1.5 68 0.12 0.24 90 0.33 5.2 60 60 1.5 5 5 0.25 0.3 Parameter Symbol Condition min typ max Unit • AN77L05/M (5V, 100mA Type) Note 1) Under Tj=25˚C, each test duration can be set short (within 10ms) and the characteristic drift with temperature rise at joints of the chip may be ignored. Note 2) VI=6V, IO=50mA, CO=10 µF unless otherwise specified. VO REGIN REGL Ibias ∆I bias Irush RR VDIF (min) 1 VDIF (min) 2 Vno ∆V O/Ta V mV mV mA mA mA dB V V µV mV/˚C Output voltage Input stability Load stability Bias current under no load Bias current fluctuation under load Bias current before regulation start Ripple rejection ratio Min. input/output voltage difference (1) Min. input/output voltage difference (2) Output noise voltage Output voltage temperature coefficient Tj=25˚C VI= 6.74 to 16.74V, Tj=25˚C IO= 0 to 100mA, Tj=25˚C IO= 0mA, Tj=25˚C IO= 0 to 100mA, Tj=25˚C VI= 5.4V, IO= 0mA, Tj=25˚C VI= 6.74 to 8.74V, f=120Hz VI=5.4V, IO=50mA, Tj=25˚C VI=5.4V, IO=100mA, Tj=25˚C f=10Hz to 100kHz Tj= –30 to+125˚C 5.76 56 6 4 11 0.9 3 1.5 66 0.12 0.25 105 0.4 6.24 60 60 1.5 5 5 0.25 0.46 Parameter Symbol Condition min typ max Unit • AN77L06/M (6V, 100mA Type) Note 1) Under Tj=25˚C, each test duration can be set short (within 10ms) and the characteristic drift with temperature rise at joints of the chip may be ignored. Note 2) VI=7V, IO=50mA, CO=10 µF unless otherwise specified. VO REGIN REGL Ibias ∆I bias Irush RR VDIF (min) 1 VDIF (min) 2 Vno ∆V O/Ta V mV mV mA mA mA dB V V µV mV/˚C |
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Similar Description - AN77L09 |
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