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SCANH16602SM Datasheet(PDF) 1 Page - National Semiconductor (TI) |
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SCANH16602SM Datasheet(HTML) 1 Page - National Semiconductor (TI) |
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1 / 9 page  SCAN16602 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE® Outputs General Description The SCAN16602 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with separate output enable and latch enable control signals. The byte-wide output enable controls are compli- mentary to allow direction control with a single R/W line and no additional logic. This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST). Features n IEEE 1149.1 (JTAG) Compliant n 2.7V to 3.6V V CC Operation n TRI-STATE outputs for bus-oriented applications n Dual byte-wide data for bus applications n Power down high Impedance inputs and outputs n Optional Bus Hold on data inputs eliminates the need for external pullup/pulldown resistors (SCANH16602, SCANH162602 versions) n Optional 25 Ω series resistors in outputs to minimize noise and eliminate termination resistors (SCAN162602, SCANH162602 versions) n Supports live insertion/withdrawal n Includes CLAMP and HIGHZ instructions Block Diagram 20051802 TRI-STATE® is a registered trademark of National Semiconductor Corporation. July 2003 © 2003 National Semiconductor Corporation DS200518 www.national.com |
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