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CMM1200-BD Datasheet(PDF) 2 Page - Mimix Broadband |
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CMM1200-BD Datasheet(HTML) 2 Page - Mimix Broadband |
2 / 6 page 3236 Scott Boulevard Santa Clara, California 95054 Phone: (408) 986-5060 Fax: (408) 986-5095 2.0 to 6.0 GHz GaAs MMIC Low-Noise Amplifier Advanced Product Information May 2005 V1.5 (1 of 5) Features ❏ Small Size: 1.60 x 1.55 x 0.076 mm ❏ Integrated On-Chip Drain Bias Coil ❏ Integrated On-Chip DC Blocking ❏ Single Bias Operation ❏ Directly Cascadable – Fully Matched, Novel Feedback & Distributed Amplifier Design ❏ P1dB: 15.5 dBm @ 6 GHz, Typ. ❏ High Linear Gain: 17.5 dB Typ. ❏ Noise Figure: 3.3 dB Typ. @ 6 GHz ❏ pHEMT Technology ❏ Silicon Nitride Passivation Specifications (TA = 25°C, Vdd = 5V) 1 Parameters Units Min Typ Max Frequency Range GHz 2.0 6.0 Linear Gain dB 16.0 17.5 Gain Variation (over operating frequency) ±dB 2.0 Power Output (@1 dB Gain Compression) dBm 14.0 15.5 P1dB Variation (over operating frequency) dBm 1.0 Saturated Output Power dBm 19.0 23.0 Third Order Intercept Point (@ 6 GHz) dBm 25.5 Second Order Intercept Point (@ 6 GHz) dBm 41.0 Noise Figure (@6 GHz) dB 3.3 3.8 Input Return Loss 2 dB -9.5 Output Return Loss 2 dB -12.0 Current mA 85 100 115 Thermal Resistance °C/W 34.0 Stability Unconditionally Stable Absolute Maximum Ratings 1 Parameter Rating Drain Voltage 4.5V (min.) / 8.0V (max.) Drain Current 150 mA Continuous Power Dissipation 1.2 W Input Power 10 dBm Storage Temperature -50°C to +150°C Channel Temperature 175°C Operating Backside Temperature 2 -40°C Min. Die Attach and Bonding Procedures Die Attach: Eutectic die attach is recommended. For eutec- tic die attach: Preform: AuSn (80% Au, 20% Sn); Stage Temperature: 290°C, ±5°C; Handling Tool: Tweezers; Time: 1 min or less. Wire Bonding: Wire Size: 0.7 to 1.0 mil in diameter (pre- stressed); Thermocompression bonding is preferred over ther- mosonic bonding. For thermocompression bonding: Stage Temperature: 250°C; Bond Tip Temperature: 150°C; Bonding Tip Pressure: 18 to 40 gms depending on size of wire. CMM1200-BD Chip Diagram Notes: 1. Tested on Celeritek connectorized evaluation board. 2. Measured on wafer. Notes: 1. Operation outside these limits can cause permanent damage. 2. Calculation maximum operating temperature: Tmax = 175–(Pdis [W] x 34) [°C]. |
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