Copyright  ANPEC Electronics Corp.

Rev. B.1 - Apr., 2003

APL5833

www.anpec.com.tw

10

Test item

Method

Description

SOLDERABILITY

MIL-STD-883D-2003

245

° C , 5 SEC

HOLT

MIL-STD-883D-1005.7

1000 Hrs Bias @ 125

°C

P C T

JESD-22-B, A102

168 Hrs, 100 % RH , 121

°C

T S T

MIL-STD-883D-1011.9

-65

°C ~ 150 °C , 200 Cycles

E S D

MIL-STD-883D-3015.7

VHBM > 2KV, VMM > 200V

Latch-Up

JESD 78

10ms , I

Reliability test Program

Carrier Tape & Reel Dimensions

A

J

B

T2

T1

C

t

Ao

E

W

Po

P

Ko

Bo

D1

D

F

P1

Application

A

B

C

J

T1

T2

W

P

E

SOT-89

178

±1

70

± 2

13.5

±

0.15

3

± 0.15

14

± 2

1.3

± 0.3

12 + 0.3

12 - 0.1

8

± 0.1 1.75± 0.1

Application

F

D

D1

Po

P1

Ao

Bo

Ko

t

SOT-89

5.5

± 0.05 1.5± 0.1 1.5± 0.1 4.0 ± 0.1 2.0 ± 0.1 4.8 ± 0.1 4.5± 0.1 1.80± 0.1 0.3±0.013

(mm)