TSL1301

102

× 1 LINEAR SENSOR ARRAY

WITH HOLD

SOES031A – NOVEMBER 1996 – REVISED MAY 1997

4

POST OFFICE BOX 655303

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Analog output voltage (white, average over 102 pixels)

1.8

2

2.2

V

Analog output voltage (dark, average over 102 pixels)

Ee = 0

0

0.3

0.4

V

PRNU

Pixel response nonuniformity

Pixels 2–101,

See Note 3

±10%

Nonlinearity of analog output voltage

See Note 4

±0.5%

Output noise voltage

Ee = 0,

See Note 5

3

mVrms

Saturation exposure

VDD = 4.5 V

5.45

7

nJ/cm2

Analog output saturation voltage

VDD = 4.5 V,

RL = 330 Ω

3

3.5

V

DSNU

Dark signal nonuniformity

All pixels,

See Note 6

Ee = 0

0.04

0.12

V

IL

Image lag

See Note 7

1%

IDD

Supply current

RL = 330 Ω

2.5

4

mA

IIH

High-level input current

VI = VDD

10

µA

IIL

Low-level input current

VI = 0

10

µA

Ci

Input capacitance

5

pF

NOTES:

2. Clock duty cycle is assumed to be 50%.

3. PRNU is the maximum difference between the voltage from any single pixel and the average output voltage from all pixels of the

device under test when the array is uniformly illuminated.

4. Nonlinearity is defined as the maximum deviation from a best-fit straight line over the dark-to-white irradiance levels, as a percent

of analog output voltage (white).

5. RMS noise is the standard deviation of a single-pixel output under constant illumination as observed over a 5-second period.

6. DNSU is the difference between the maximum and minimum of dark-current voltage.

7. Image lag is a residual signal left in a pixel from a previous exposure. It is defined as a percent of white-level signal remaining after

a pixel is exposed to a white condition followed by a dark condition:

IL

+

V

AO

–V

AO(dark)

V

VAO(dark)

100