HANBit

HMF1M32M8P

HANBit Electronics Co., Ltd.

REV.02(August,2002)

4

ERASE AND PROGRAMMING PERFORMANCE

LIMITS

PARAMETER

MIN.

TYP.

MAX.

UNIT

COMMENTS

Sector Erase Time

-

1

8

sec

Excludes 00H programming

prior to erasure

Byte Programming Time

-

7

300

µs

Excludes system-level

overhead

Chip Programming Time

-

3.6

10.8

sec

Excludes system-level

overhead

CAPACITANCE

PARAMETER

SYMBOL

PARAMETER

DESCRIPTION

TEST SETUP

TYP.

MAX

UNIT

Input Capacitance

4

6

pF

Output Capacitance

8

12

pF

Control Pin Capacitance

8

12

pF

AC CHARACTERISTICS

u Read Only Operations Characteristics

PARAMETER

SYMBOLS

JEDEC

STANDARD

DESCRIPTION

TEST SETUP

-55

-90

UNIT

Read Cycle Time

Min

55

90

ns

Address to Output Delay

Max

55

90

ns

Chip Enable to Output Delay

Max

55

90

ns

Chip Enable to Output Delay

Max

30

35

ns

Chip Enable to Output High-Z

Max

18

20

ns

Output Enable to Output High-Z

Max

18

20

ns

Output Hold Time From Addresses,

/CE or /OE, Whichever Occurs First

Min

0

0

ns

Notes : Test Conditions : Output Load : 1TTL gate and Output Load Capacitance 100 pF, in case of 55ns-30pF

Input rise and fall times : 5 ns , In case of 55ns-5ns

Input pulse levels : 0 .45V to 2.4V, In case of 55ns- 0.0V-3.0V

Timing measurement reference level