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HX6408XVFN Datasheet(PDF) 7 Page - Honeywell Solid State Electronics Center

Part # HX6408XVFN
Description  512k x 8 STATIC RAM
Download  11 Pages
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Manufacturer  HONEYWELL [Honeywell Solid State Electronics Center]
Direct Link  http://honeywell.com/Pages/Home.aspx
Logo HONEYWELL - Honeywell Solid State Electronics Center

HX6408XVFN Datasheet(HTML) 7 Page - Honeywell Solid State Electronics Center

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HX6408
Advanced Information
7
www.honeywell.com
ASYCHRONOUS READ CYCLE AC TIMING CHARACTERISTICS (1)
Worst Case (3)
-55 to 125°C
Symbol
Parameter
Typical
(2)
Min
Max
Units
TAVAVR
Address Read Cycle Time
300KRad
1MRad
20
25
ns
TAVQV
Address Access Time
300KRad
1MRad
20
25
ns
TAXQX
Address Change to Output Invalid Time
3
ns
TSLQV
Chip Select Access Time
300KRad
1MRad
20
25
ns
TSLQX
Chip Select Output Enable Time
4
ns
TSHQZ
Chip Select Output Disable Time
8
ns
TPHQV
Sleep Enable Access Time
25
ns
TPHQX
Sleep Enable Output Enable Time
5
ns
TPLQZ
Sleep Enable Output Disable Time
10
ns
TGLQV
Output Enable Access Time
5
ns
TGLQX
Output Enable Output Enable Time
0
ns
TGHQZ
Output Enable Output Disable Time
5
ns
(1) Test conditions: input switching levels, VIL/VIH=0V/3V, input rise and fall times <1 ns/V, input and output timing reference levels shown in
the Tester AC Timing Characteristics table, capacitive output loading CL≥50 pF, or equivalent capacitive output loading CL=5 pF for
TSHQZ, TPLQZ TGHQZ. For CL>50 pF, derate access times by 0.02 ns/pF (typical).
(2) Typical operating conditions: VDD=3.3V, TA=25°C, pre-radiation.
(3) Worst case operating conditions: VDD=3.0V to 3.6V, TA=-55°C to 125°C, post total dose 25°C at
ADDRESS
NCS
DATA OUT
NSL
NOE
DATA VALID
HIGH
IMPEDANCE
TAVAVR
TSLQV
TPHQX
TPHQV
TGLQV
TAXQX
TSLQX
TGLQX
TAVQV
TSHQZ
TPLQZ
TGHQZ


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