IC41C82002

IC41LV82002

Integrated Circuit Solution Inc.

5

DR017-0A 06/22/2001

(Recommended Operating Conditions unless otherwise noted.)

Symbol Parameter

Test Condition

Speed Min.

Max.

Unit

Input Leakage Current

–5

5

µA

Other inputs not under test = 0V

Output Leakage Current

Output is disabled (Hi-Z)

–5

5

µA

Output High Voltage Level

2.4

—

V

Output Low Voltage Level

—

0.4

V

Standby Current: TTL

5V

—

2

mA

3.3V

—

0.5

Standby Current: CMOS

5V

—

1

mA

3.3V

—

0.5

Operating Current:

RAS, CAS,

-50

—

120

mA

-60

—

110

Average Power Supply Current

Operating Current:

-50

—

90

mA

-60

—

80

Average Power Supply Current

Refresh Current:

-50

—

120

mA

-60

—

110

Average Power Supply Current

Refresh Current:

RAS, CAS Cycling

-50

—

120

mA

-60

—

110

Average Power Supply Current

Notes:

1. An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycles (RAS-Only or CBR) before proper device

2. Dependent on cycle rates.

3. Specified values are obtained with minimum cycle time and the output open.

4. Column-address is changed once each EDO page cycle.

5. Enables on-chip refresh and address counters.