 |
Electronic Components Datasheet Search |
|
|
Electronic Components Datasheet Search |
|
N74F174D Datasheet(PDF) 4 Page - NXP Semiconductors |
|
||||||||||||||||||||||||||||||
N74F174D Datasheet(HTML) 4 Page - NXP Semiconductors |
|
|
4 / 8 page  Philips Semiconductors Product specification 74F174 Hex D flip-flop October 7, 1988 4 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VO High level output voltage VCC = MIN, VIL = MAX ±10%VCC 2.5 V VOH High-level output voltage VIH = MIN, IOH = MAX ±5%VCC 2.7 3.4 V VO Low level output voltage VCC = MIN, VIL = MAX ±10%VCC 0.30 0.50 V VOL Low-level output voltage VIH = MIN, IOL = MAX ±5%VCC 0.30 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA IOS Short-circuit output current3 VCC = MAX –60 –150 mA ICC Supply current (total) VCC = MAX, Dn = MR = 4.5V, CP = ↑ 35 45 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITION VCC = +5.0V Tamb = +25°C CL = 50pF, RL = 500Ω VCC = +5.0V ± 10% Tamb = 0°C to +70°C CL = 50pF, RL = 500Ω UNIT MIN TYP MAX MIN MAX fMAX Maximum clock frequency Waveform 1 80 100 80 MHz tPLH tPHL Propagation delay CP to Qn Waveform 1 3.5 4.5 5.5 6.0 8.0 10.0 3.5 4.5 9.0 11.0 ns tPHL Propagation delay MR to Qn Waveform 2 5.0 8.5 14.0 5.0 15.0 ns AC SETUP REQUIREMENTS LIMITS SYMBOL PARAMETER TEST CONDITION VCC = +5.0V Tamb = +25°C CL = 50pF, RL = 500Ω VCC = +5.0V ± 10% Tamb = 0°C to +70°C CL = 50pF, RL = 500Ω UNIT MIN TYP MAX MIN MAX tS(H) tS(L) Setup time, High or Low Dn to CP Waveform 3 4.0 4.0 4.0 4.0 ns th(H) th(L) Hold time, High or Low Dn to CP Waveform 3 0.0 0.0 0.0 0.0 ns tw(H) tw(L) CP Pulse width, High or Low Waveform 1 4.0 6.0 4.0 6.0 ns tw(L) MR Pulse width, Low Waveform 2 5.0 5.0 ns tREC Recovery time, MR to CP Waveform 2 5.0 5.0 ns |
Similar Part No. - N74F174D |
|
Similar Description - N74F174D |
|
|
|
Link URL |
| Privacy Policy |
| ALLDATASHEET.NET |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
English ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
