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N74F8960N Datasheet(PDF) 8 Page - NXP Semiconductors |
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N74F8960N Datasheet(HTML) 8 Page - NXP Semiconductors |
8 / 11 page Philips Semiconductors FAST Products Product specification 74F8960/74F8961 Octal latched bidirectional Futurebus transceivers (3-State + open-collector) December 19, 1990 8 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST LIMITS UNIT CONDITIONS1 MIN. TYP. 2 MAX. IOH High–level output current B0 – B7 VCC = MAX, VIL = MAX, VIH = MIN, VOH = 2.1V 100 µA IOFF Power–off output current B0 – B7 VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 2.1V 100 µA VCC = MIN, IOH = –3mA, VX =VCC 2.5 VCC V VOH High-level output voltage A0 – A74 VIL = MAX, VIH = MIN IOH = –4mA, VX =3.13V and 3.47V 2.5 V A0 – A74 VCC = MIN, IOL = 20mA, VX = VCC 0.50 V VOL Low-level output voltage B0 – B78 VIL = MAX IOL = 100mA 1.15 V VIH = MIN IOL = 4mA 0.40 V VIK Input clamp voltage A0 – A7 VCC = MIN, II = IIK -0.5 V Except A0 – A7 VCC = MIN, II = IIK -1.2 V II Input current at OEBn, OEA, LE VCC = MAX, VI = 7.0V 100 µA maximum input voltage A0–A7, B0 – B7 VCC = MAX, VI = 5.5V 1 mA IIH High–level input current OEBn, OEA, LE VCC = MAX, VI = 2.7V 20 µA B0–B7 VCC = MAX, VI = 2.1V, Bn – An = 0V 100 µA IIL Low–level input current OEBn, OEA, LE VCC = MAX, VI = 0.5V –20 µA B0 – B7 VCC = MAX, VI = 0.3V –100 µA IOZH + IIH Off–state output current, high–level current applied A0 – A7 VCC = MAX, VO = 2.7V 70 µA IOZL + IIL Off–state output current, low–level voltage applied A0 – A7 VCC = MAX, VI = 0.5V –70 µA IX High–level control current VCC = MAX, VX = VCC, LE = OEA = OEBn = 2.7V, A0 – A7 = 2.7V, B0 – B7 = 2.0V, –100 100 µA VCC = MAX, VX = 3.13 & 3.47V, LE = OEA = OEBn = A0 – A7 = 2.7V, B0 – B7 = 2.0V, –10 10 µA IOS Short circuit output A0–A7 only ’F8960 74F8960 VCC = MAX, Bn = 1.3V, OEA = 2.0V, OEBn = 2.7V -60 -150 mA current3 only 74F8961 VCC = MAX, Bn = 1.8V, OEA = 2.0V, OEBn = 2.7V ICCH VCC = MAX 65 100 mA ICC Supply current (total) ICCL VCC = MAX, VIL = 0.5V 100 145 mA ICCZ 75 100 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type and function table for operating mode. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 4. Due to test equipment limitations, actual test conditions are for VIH =1.8v and VIL = 1.3V. |
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