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White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com

White Electronic Designs

WMF512K8-XXX5

November 2005

Rev. 6

White Electronic Designs Corp. reserves the right to change products or specifications without notice.

AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,CS# CONTROLLED

Parameter

Symbol

-60

-70

-90

-120

-150

Unit

Min

Max

Min

Max

Min

Max

Min

Max

Min

Max

Write Cycle Time

60

70

90

120

150

ns

Write Enable Setup Time

00000

ns

Chip Select Pulse Width

40

45

45

50

50

ns

Address Setup Time

00000

ns

Data Setup Time

40

45

45

50

50

ns

Data Hold Time

00000

ns

Address Hold Time

40

45

45

50

50

ns

Chip Select Pulse Width High

20

20

20

20

20

ns

Duration of Byte Programming Operation (1)

300

300

300

300

300

µs

Sector Erase Time (2)

15

15

15

15

15

sec

Read Recovery Time

00000

ns

Chip Programming Time

11

11

11

11

11

sec

Chip Erase Time (3)

64

64

64

64

64

sec

NOTES:

3. Typical value for Chip Erase time is 8sec.

AC TEST CIRCUIT

AC Test Conditions

Parameter

Typ

Unit

Input Pulse Levels

VIL = 0, VIH = 3.0

V

Input Rise and Fall

5

ns

Input and Output Reference Level

1.5

V

Output Timing Reference Level

1.5

V

Notes:

Ω.

ATE tester includes jig capacitance.

I

Current Source

D.U.T.

C

= 50 pf

eff

I

OL

V

1.5V

(Bipolar Supply)

Z

Current Source

OH