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CLC020BCQ Datasheet(PDF) 11 Page - National Semiconductor (TI) |
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CLC020BCQ Datasheet(HTML) 11 Page - National Semiconductor (TI) |
11 / 15 page Application Information (Continued) MEASURING JITTER The test method used to obtain the timing jitter value given in the AC Electrical Specification table is based on procedures and equipment described in SMPTE RP 192-1996. The rec- ommended practice discusses several methods and indica- tor devices. An FFT method performed by standard video test equipment was used to obtain the data given in this data sheet. As such, the jitter characteristics (or jitter floor) of the measurement equipment, particularly the measurement ana- lyzer, become integral to the resulting jitter value. The method and equipment were chosen so that the test can be easily duplicated by the design engineer using most stan- dard digital video test equipment. In so doing, similar results should be achieved. The intrinsic jitter floor of the CLC020’s PLL is approximately 25% of the typical jitter given in the electrical specifications. In production, device jitter is mea- sured on automatic IC test equipment (ATE) using a different method compatible with that equipment. Jitter measured using this ATE yields values approximately 50% of those obtained using the video test equipment. The jitter test setup used to obtain values quoted in the data sheet consists of: • National Semiconductor SD020EVK, CLC020 evaluation kit • Tektronix TG2000 signal generation platform with DVG1 option • Tektronix VM700T Option 1S Video Measurement Set • Tektronix TDS 794D, Option C2 oscilloscope • Tektronix P6339A passive probe • 75 Ohm coaxial cable, 3ft., Belden 8281 or RG59 (2 required) • ECL-to-TTL/CMOS level converter/amplifier, Figure 10 Apply the black-burst reference clock from the TG2000 sig- nal generator’s BG1 module 27MHz clock output to the level converter input. The clock amplitude converter schematic is shown in Figure 9. Adjust the input bias control to give a 50% duty cycle output as measured on the oscilloscope/probe system. Connect the level translator to the SD020EVK board, connector P1, P CLK pins (the outer-most row of pins 10091709 Connect LOCK DETECT to TPG ENABLE for test pattern generator function. Remove RP1 & RP3 and replace RP2 & RP4 with 50 Ω resistor packs for coax interfacing. Install RP1-4 when using ribbon cable for input interfacing. This board is designed for use with TTL power supplies only. For optional ECL compatible load: R1A = R2A = 187; R1B = R2B = 124. All resistances & impedances in Ohms. Values with 3 significant digits are 1%; with 2 digits 5%. FIGURE 8. SD020EVK Schematic Diagram www.national.com 11 |
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