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IDT7014S12JI Datasheet(PDF) 4 Page - Integrated Device Technology |
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IDT7014S12JI Datasheet(HTML) 4 Page - Integrated Device Technology |
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4 / 9 page  IDT7014S High-Speed 4K x 9 Dual-Port Static RAM Industrial and Commercial Temperature Ranges 4 DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range (VCC = 5V ± 10%) AC Test Conditions Capacitance(1) (TA = +25°C, f = 1.0MHz) TQFP Package Only NOTES: 1. This parameter is determined by device characteristics but is not production tested. 2. 3dv references the interpolated capacitance when the input and output signals swith from 0V to 3V or from 3V to 0V. Figure 1. AC Output Test Load. Figure 2. Output Test Load (for tHZ, tWZ, and tOW) *Including scope and jig. Figure 3. Typical Output Derating (Lumped Capacitive Load). NOTES: 1. At f = fmax, address inputs are cycling at the maximum read cycle of 1/tRC using the "AC Test Conditions" input levels of GND to 3V. 893 Ω 30pF 347 Ω DATAOUT 5V 5V 893 Ω 5pF* 347 Ω DATAOUT 2528 drw 05 2528 drw 04 1 2 3 4 5 6 7 8 20 40 100 60 80 120 140 160 180 200 tAA (Typical, ns) Capacitance (pF) 2528 drw 06 -1 0 - 10pF is the I/O capacitance of this device, and 30pF is the AC Test Load Capacitance , Symbol Parameter Test Condition Version 7014S12 Com'l Only 7014S15 Com'l & Ind Unit Typ. Max Typ. Max ICC Dynamic Operating Current (Both Ports Active) Outputs Open f = fMAX (1) COM'L S 160 250 160 250 mA IND S ____ ____ 160 260 2528 tbl 05a Symbol Parameter Test Condition Version 7014S20 Com'l & Ind 7014S25 Com'l & Ind Unit Typ. Max Typ. Max. ICC Dynamic Operating Current (Both Ports Active) Outputs Open f = fMAX (1) COM'L S 155 245 150 240 mA IND S 155 260 150 255 2528 tbl 05b Input Pulse Levels Input Rise/Fall Times Input Timing Reference Levels Output Reference Levels Output Load GND to 3.0V 3ns Max. 1.5V 1.5V Figures 1,2 and 3 2528 tbl 06 Symbol Parameter Conditions (2) Max. Unit CIN Input Capacitance VIN = 3dV 9 pF COUT Output Capacitance VOUT = 3dV 10 pF 2528 tbl 07 |
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