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IDT7014S20JI Datasheet(PDF) 8 Page - Integrated Device Technology |
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IDT7014S20JI Datasheet(HTML) 8 Page - Integrated Device Technology |
8 / 9 page IDT7014S High-Speed 4K x 9 Dual-Port Static RAM Industrial and Commercial Temperature Ranges 8 Truth Table I Read/Write Control Timing Waveform of Write Cycle(1,2,3,4,5) Functional Description The IDT7014 provides two ports with separate control, address, and I/O pins that permit independent access for reads or writes to any location in memory. It lacks the chip enable feature of CMOS Dual Ports, thus it operates in active mode as soon as power is applied. Each port has its own Output Enable control ( OE).Inthereadmode,theport’s OEturnsontheoutputdriverswhensetLOW. Theuserapplicationshould avoidsimultaneouswriteoperationstothesamememorylocation.There is no on-chip arbitration circuitry to resolve write priority and partial data from both ports may be written. READ/WRITE conditions are illustrated in Table 1. NOTE: 1. AOL - A11L is not equal to AOR - A11R. 'H' = HIGH,'L' = LOW, 'X' = Don’t Care, and 'Z' = HIGH Impedance. 2528 drw 10 R/ W tWP tDW DATAOUT ADDRESS DATAIN OE tAW tAS (5) tWR tDH tOW tHZ (4) (3) (3) tWZ (4) Left or Right Port(1) R/ WOE D0-8 Function LXDATAIN Data written into memory HL DATAOUT Data in memory output on port X H Z High-impedance outputs 2528 tbl 10 NOTES: 1. R/ W must be HIGH during all address transitions. 2. tWR is measured from R/ W going HIGH to the end of write cycle. 3. During this period, the I/O pins are in the output state, and input signals must not be applied. 4. Transition is measured 0mV from the Low or High-impedance voltage with the Output Test Load (Figure 2). 5. If OE is LOW during a R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off data to be placed on the bus for the required tDW. If OE is HIGH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the specified tWP. |
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