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IDT7014S20JI Datasheet(PDF) 8 Page - Integrated Device Technology

Part # IDT7014S20JI
Description  HIGH-SPEED 4K x 9DUAL-PORT STATIC RAM
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

IDT7014S20JI Datasheet(HTML) 8 Page - Integrated Device Technology

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IDT7014S
High-Speed 4K x 9 Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
8
Truth Table I – Read/Write Control
Timing Waveform of Write Cycle(1,2,3,4,5)
Functional Description
The IDT7014 provides two ports with separate control, address,
and I/O pins that permit independent access for reads or writes to
any location in memory. It lacks the chip enable feature of CMOS Dual
Ports, thus it operates in active mode as soon as power is applied. Each
port has its own Output Enable control (
OE).Inthereadmode,theport’s
OEturnsontheoutputdriverswhensetLOW. Theuserapplicationshould
avoidsimultaneouswriteoperationstothesamememorylocation.There
is no on-chip arbitration circuitry to resolve write priority and partial data
from both ports may be written. READ/WRITE conditions are illustrated
in Table 1.
NOTE:
1. AOL - A11L is not equal to AOR - A11R.
'H' = HIGH,'L' = LOW, 'X' = Don’t Care, and 'Z' = HIGH Impedance.
2528 drw 10
R/
W
tWP
tDW
DATAOUT
ADDRESS
DATAIN
OE
tAW
tAS
(5)
tWR
tDH
tOW
tHZ
(4)
(3)
(3)
tWZ (4)
Left or Right Port(1)
R/
WOE
D0-8
Function
LXDATAIN
Data written into memory
HL
DATAOUT
Data in memory output on port
X
H
Z
High-impedance outputs
2528 tbl 10
NOTES:
1. R/
W must be HIGH during all address transitions.
2. tWR is measured from R/
W going HIGH to the end of write cycle.
3. During this period, the I/O pins are in the output state, and input signals must not be applied.
4. Transition is measured 0mV from the Low or High-impedance voltage with the Output Test Load (Figure 2).
5. If
OE is LOW during a R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off data to be
placed on the bus for the required tDW. If
OE is HIGH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as
the specified tWP.


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