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AU5790D Datasheet(PDF) 6 Page - NXP Semiconductors |
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AU5790D Datasheet(HTML) 6 Page - NXP Semiconductors |
6 / 20 page Philips Semiconductors Product data AU5790 Single wire CAN transceiver 2001 May 18 6 ABSOLUTE MAXIMUM RATINGS According to the IEC 134 Absolute Maximum System: operation is not guaranteed under these conditions; all voltages are referenced to pin 8 (GND); positive currents flow into the IC, unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT VBAT Supply voltage Steady state –0.3 +27 V VBATld Short-term supply voltage Load dump; ISO7637/1 test pulse 5 (SAE J1113, test pulse 5), T < 1s +40 V VBATtr2 Transient supply voltage ISO 7637/1 test pulse 2 (SAE J1113, test pulse 2), with series diode and bypass cap of 100 nF between BAT and GND pins, Note 2. +100 V VBATtr3 Transient supply voltage ISO 7637/1 pulses 3a and 3b (SAE J1113 test pulse 3a and 3b), Note 2. –150 +100 V VCANH_1 CANH voltage VBAT > 2 V –10 +18 V VCANH_0 CANH voltage VBAT < 2 V –16 +18 V VCANHtr1 Transient bus voltage ISO 7637/1 test pulse 1, Notes 1 and 2 –100 V VCANHtr2 Transient bus voltage ISO 7637/1 test pulse 2, Notes 1 and 2 +100 V VCANHtr3 Transient bus voltage ISO 7637/1 test pulses 3a, 3b, Notes 1 and 2 –150 +100 V VRTH1 Pin RTH voltage VBAT > 2 V, voltage applied to pin RTH via a 2 k Ω series resistor –10 +18 V VRTH0 Pin RTH voltage VBAT < 2 V, voltage applied to pin RTH via a 2 k Ω series resistor –16 +18 V VI DC voltage on pins TxD, EN, RxD, NSTB –0.3 +7 V ESDBAHB ESD capability of pin BAT Direct contact discharge, R=1.5 k Ω, C=100 pF –8 +8 kV ESDCHHB ESD capability of pin CANH Direct contact discharge, R=1.5 k Ω, C=100 pF –8 +8 kV ESDRTHB ESD capability of pin RTH Direct contact discharge, R=1.5 k Ω + 3 kΩ, C=100 pF –8 +8 kV ESDLGHB ESD capability of pins TxD, NSTB, EN, RxD, and RTH Direct contact discharge, R=1.5 k Ω , C=100 pF –2 +2 kV RTmin Bus load resistance RT being connected to pin RTH 2 k Ω Tamb Operating ambient temperature –40 +125 °C Tstg Storage temperature –40 +150 °C Tvj Junction temperature –40 +150 °C NOTES: 1. Test pulses are coupled to CANH through a series capacitance of 1 nF. 2. Rise time for test pulse 1: tr < 1 µs; pulse 2: tr < 100 ns; pulses 3a/3b: tr < 5 ns. |
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