Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation

ÄÅ

Parameter

Test Conditions

Min

Max

Min

Max

Drain-to-Source Breakdown Voltage

60

—

60

—

V

Gate Threshold Voltage

2.0

4.0

1.5

4.0

Gate-to-Source Leakage Forward

—

100

—

100

nA

Gate-to-Source Leakage Reverse

—

-100

—

-100

Zero Gate Voltage Drain Current

—

10

—

25

µA

Static Drain-to-Source

Ã

—

0.044

—

0.053

Ω

On-State Resistance (TO-3)

Static Drain-to-Source

Ã

—

0.04

—

0.048

Ω

On-State Resistance (TO-257AA)

International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.

The hardness assurance program at International Rectifier is comprised of two radiation environments.

Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both

pre- and post-irradiation performance are tested and specified using the same drive circuitry and test

conditions in order to provide a direct comparison.

Radiation Characteristics

1. Part numbers IRHY57034CM ( JANSR2N7483T3 ) , IRHY53034CM ( JANSF2N7483T3 ) and IRHY54034CM ( JANSG2N7483T3 )

2. Part number IRHY58034CM ( JANSH2N7483T3 )

Fig a. Single Event Effect, Safe Operating Area

Diode Forward Voltage

Ã

—

1.2

—

1.2

V

International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for

Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.

For footnotes refer to the last page

www.irf.com

3

IRHY57034CM, JANSR2N7483T3

Ion

LET

Energy

Range

(MeV)

(µm)

Br

37.3

285

36.8

60

60

60

60

40

Xe

63

300

29

46

46

35

25

15

Au

86.6

2068

106

35

35

27

20

14

Table 2. Single Event Effect Safe Operating Area

0

10

20

30

40

50

60

70

-20

-15

-10

-5

0

VGS

Br

I

Au