6

6

6

6

6

White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520

White Electronic Designs

WEDPNF8M722V-XBX

Parameter/Condition

Parameter/Condition

Parameter/Condition

Parameter/Condition

Parameter/Condition

Symbol

Symbol

Symbol

Symbol

Symbol

Units

Units

Units

Units

Units

Min

Min

Min

Min

Min

Max

Max

Max

Max

Max

Supply Voltage

3

3.6

V

Input High Voltage: Logic 1; All inputs (4)

0.7 x Vcc

V

Input Low Voltage: Logic 0; All inputs (4)

-0.3

0.8

V

SDRAM

SDRAM

SDRAM

SDRAM

SDRAM

-5

5

µA

(All other pins not under test = 0V)

SDRAM Input Leakage Address Current

(All other pins not under test = 0V)

-25

25

µA

-5

5

µA

2.4

–

V

–

0.4

V

Flash

Flash

Flash

Flash

Flash

10

µA

10

µA

V

0.45

V

2.3

2.5

V

NOTES:

1. All voltages referenced to VSS.

2. This parameter is not tested but guaranteed by design. f = 1 MHz, TA = 25°C.

3. An initial pause of 100ms is required after power-up, followed by two AUTO REFRESH commands, before proper device operation is ensured. (VCC must be

powered up simultaneously.) The two AUTO REFRESH command wake-ups should be repeated any time the tREF refresh requirement is exceeded.

4. VIH overshoot: VIH (MAX) = VCC + 2V for a pulse width

≤ 3ns, and the pulse width cannot be greater than one third of the cycle rate. VIL undershoot: VIL

(MIN) = -2V for a pulse width

≤ 3ns.

5. Guaranteed by design, but not tested.

P

PP

PParameter

arameter

arameter

arameter

arameter

Unit

Unit

Unit

Unit

Unit

-0.5 to +4.0

V

Signal Voltage Range

-0.5 to Vcc +0.5

V

-55 to +125

°C

-40 to +85

°C

Storage Temperature, Plastic

-65 to +150

°C

Flash Endurance (write/erase cycles)

1,000,000 min.

cycles

NOTE:

NOTE:

NOTE:

NOTE:

NOTE:

Stress greater than those listed under "Absolute Maximum Ratings" may cause

permanent damage to the device. This is a stress rating only and functional

operation of the device at these or any other conditions greater than those

indicated in the operational sections of this specification is not implied.

Exposure to absolute maximum rating conditions for extended periods may

affect reliability.

P

PP

PParameter

arameter

arameter

arameter

arameter

Symbol

Symbol

Symbol

Symbol

Symbol

Max

Max

Max

Max

Max

Unit

Unit

Unit

Unit

Unit

Input Capacitance: CLK

8pF

32

pF

InputCapacitance:Allotherinput-onlypins

8pF

Input/Output Capacitance: I/Os

12

pF

Flash Address Capacitance

15

pF

Flash Data Capacitance

10

pF

FOE, FWE, RST

20

pF

Parameter

Parameter

Parameter

Parameter

Parameter

Test Conditions

Test Conditions

Test Conditions

Test Conditions

Test Conditions

Min

Min

Min

Min

Min

Unit

Unit

Unit

Unit

Unit

Minimum Pattern Data

150°C

10

Years

Retention Time

125°C

20

Years