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ADP1823 Datasheet(PDF) 5 Page - Analog Devices |
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ADP1823 Datasheet(HTML) 5 Page - Analog Devices |
5 / 32 page ADP1823 Rev. A | Page 5 of 32 ABSOLUTE MAXIMUM RATINGS Table 2. Parameter Rating IN, EN1, EN2 −0.3 V to +20 V BST1, BST2 −0.3 V to +30 V BST1, BST2 to SW1, SW2 −0.3 V to +6 V CSL1, CSL2 −1 V to +30 V SW1, SW2 −2 V to +30 V DH1 SW1 − 0.3 V to BST1 + 0.3 V DH2 SW2 − 0.3 V to BST2 + 0.3 V DL1, DL2 to PGND −0.3 V to PV + 0.3 V PGND to GND ±2 V LDOSD, SYNC, FREQ, COMP1, COMP2, SS1, SS2, FB1, FB2, VREG, PV, POK1, POK2, TRK1, TRK2 −0.3 V to +6 V θJA 4-Layer (JEDEC Standard Board)1, 2 45°C/W Operating Ambient Temperature3 −40°C < TA< +85°C Operating Junction Temperature3 −40°C < TJ < +125°C Storage Temperature −65°C to +150°C 1 Measured with exposed pad attached to PCB. 2 Junction-to-ambient thermal resistance (θJA) of the package is based on modeling and calculation using a 4-layer board. The junction-to-ambient thermal resistance is application and board-layout dependent. In applications where high maximum power dissipation exists, attention to thermal dissipation issues in board design is required. For more information, please refer to Application Note AN-772, A Design and Manufacturing Guide for the Lead Frame Chip Scale Package (LFCSP). 3 In applications where high power dissipation and poor package thermal resistance are present, the maximum ambient temperature may have to be derated. Maximum ambient temperature (TA_MAX) is dependent on the maximum operating junction temperature (TJ_MAX_OP = 125oC), the maximum power dissipation of the device in the application (PD_MAX), and the junction- to-ambient thermal resistance of the part/package in the application (θJA), is given by the following equation: TA_MAX = TJ_MAX_OP – (θJA x PD_MAX). Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ESD CAUTION |
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