42

SMHF SERIES

SINGLE AND DUAL

15 WATT

Definitions

Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534

SEM: Scanning Electron Microscopy

SLAM™: Scanning Laser Acoustic Microscopy

C-SAM: C - Mode Scanning Acoustic Microscopy

Notes

M/S Active components (Microcircuit and Semiconductor Die)

P

Passive components

(O)

H

K

M/S

P

M/S

P

M/S

P

Element Electrical

yes

no

yes

yes

yes

yes

Element Visual

no

no

yes

yes

yes

yes

Internal Visual

no

no

yes

no

yes

no

Temperature Cycling

no

no

no

no

yes

yes

Constant Acceleration

no

no

no

no

yes

yes

Interim Electrical

no

no

no

no

yes

no

Burn-in

no

no

no

no

yes

no

Post Burn-in Electrical

no

no

no

no

yes

no

Steady State Life

no

no

no

no

yes

no

Voltage Conditioning /Aging

no

no

no

no

no

yes

Visual Inspection

no

no

no

no

no

yes

Final Electrical

no

no

yes

yes

yes

yes

Wire Bond Evaluation

no

no

yes

yes

yes

yes

SEM

no

no

no

no

yes

no

SLAM™/C-SAM:

Input capacitors only

no

no

no

yes

no

yes

(Add’l test, not req. by H or K)